International audienceIn this work we caution that future nanometer circuits will contain undetected timing errors and also will be subject of very high soft-error rates. Thus, fault tolerant techniques will become necessary even for commodity applications. This work considers the implementation of a new soft error and timing error detecting technique based on time redundancy. The obtained results show that detection of such temporal faults can be achieved by means of meaningful hardware and performance cost
This thesis deals primarily with the problem of soft-error tolerance in digital machines. The possib...
This paper proposes the use of metrics to refine system design for soft errors protection in system ...
With technology scaling, vulnerability to soft errors in random logic is increasing. There is a need...
IC technologies are approaching the ultimate limits of silicon in terms of channel width, power supp...
ISBN: 076950146XThe increased operating frequencies, geometry shrinking and power supply reduction t...
IC technologies are approaching the ultimate limits of silicon in terms of channel width, power supp...
Abstract—Timing failures of high complexity- high frequency circuit designs, which are mainly caused...
Abstract—Timing error tolerance turns to be an important design parameter in nanometer technology, h...
International audienceTiming failures in high complexity - high frequency ...
Nanometer circuits are becoming increasingly susceptible to soft-errors due to alpha-particle and at...
Soft-errors have become a major reliability threat in advanced CMOS technologies. In this talk we pr...
ISBN 2-913329-54-3Integrated circuit technology is approaching the ultimate limits of silicon in ter...
ISBN 978-1-4244-2952-3International audienceDue to the notable change of channel width, supply volta...
Single-Event Effects are an increasingly important issue in electronic circuits due to technology sc...
The threat of soft error induced system failure in high performance computing systems has become mor...
This thesis deals primarily with the problem of soft-error tolerance in digital machines. The possib...
This paper proposes the use of metrics to refine system design for soft errors protection in system ...
With technology scaling, vulnerability to soft errors in random logic is increasing. There is a need...
IC technologies are approaching the ultimate limits of silicon in terms of channel width, power supp...
ISBN: 076950146XThe increased operating frequencies, geometry shrinking and power supply reduction t...
IC technologies are approaching the ultimate limits of silicon in terms of channel width, power supp...
Abstract—Timing failures of high complexity- high frequency circuit designs, which are mainly caused...
Abstract—Timing error tolerance turns to be an important design parameter in nanometer technology, h...
International audienceTiming failures in high complexity - high frequency ...
Nanometer circuits are becoming increasingly susceptible to soft-errors due to alpha-particle and at...
Soft-errors have become a major reliability threat in advanced CMOS technologies. In this talk we pr...
ISBN 2-913329-54-3Integrated circuit technology is approaching the ultimate limits of silicon in ter...
ISBN 978-1-4244-2952-3International audienceDue to the notable change of channel width, supply volta...
Single-Event Effects are an increasingly important issue in electronic circuits due to technology sc...
The threat of soft error induced system failure in high performance computing systems has become mor...
This thesis deals primarily with the problem of soft-error tolerance in digital machines. The possib...
This paper proposes the use of metrics to refine system design for soft errors protection in system ...
With technology scaling, vulnerability to soft errors in random logic is increasing. There is a need...