International audienceIn this paper is studied the efficiency of a software approach developed to provide processor-based architectures with error detection capabilities. Considered errors are the bit flips resulting from the interaction of charged particles with the silicon. The method is illustrated with results obtained when running different programs on a pipelined digital signal processor. Obtained results, coming from both radiation experiments and software fault injection sessions, put in evidence a high error detection capability
Hardware errors are on the rise with reducing chip sizes, and power constraints have necessitated th...
International audienceIn this paper is described a purely software technique allowing to detect SEUs...
Embedded systems are increasingly deployed in harsh environments that their components were not nece...
International audienceIn this paper is studied the efficiency of a software approach developed to pr...
International audienceThis-paper characterizes the effectiveness of an error detection technique tha...
ISBN 1402075286A software technique allowing soft errors detection occurring in processor-based digi...
The improvement of dependability in computing systems requires the evaluation of fault tolerance mec...
International audienceThe effects of transient bit flips on the operation of processor based archite...
Increasing design complexity for current and future generations of microelectronic technologies lead...
A powerful technique particularly appropriate for the detection of errors caused by transient faults...
This paper presents the principles of two different approaches for the study of the effect of transi...
ISBN 2-84813-004-0This thesis is devoted to the study of a software methodology for detection of the...
International audienceSingle Event Upset (SEU) phenomena is becoming a major concern in applications...
This thesis discusses the types of transient faults caused by heavy-ion or a-particle radiation that...
International audienceThis paper investigates a new technique to predict error rates in digital arch...
Hardware errors are on the rise with reducing chip sizes, and power constraints have necessitated th...
International audienceIn this paper is described a purely software technique allowing to detect SEUs...
Embedded systems are increasingly deployed in harsh environments that their components were not nece...
International audienceIn this paper is studied the efficiency of a software approach developed to pr...
International audienceThis-paper characterizes the effectiveness of an error detection technique tha...
ISBN 1402075286A software technique allowing soft errors detection occurring in processor-based digi...
The improvement of dependability in computing systems requires the evaluation of fault tolerance mec...
International audienceThe effects of transient bit flips on the operation of processor based archite...
Increasing design complexity for current and future generations of microelectronic technologies lead...
A powerful technique particularly appropriate for the detection of errors caused by transient faults...
This paper presents the principles of two different approaches for the study of the effect of transi...
ISBN 2-84813-004-0This thesis is devoted to the study of a software methodology for detection of the...
International audienceSingle Event Upset (SEU) phenomena is becoming a major concern in applications...
This thesis discusses the types of transient faults caused by heavy-ion or a-particle radiation that...
International audienceThis paper investigates a new technique to predict error rates in digital arch...
Hardware errors are on the rise with reducing chip sizes, and power constraints have necessitated th...
International audienceIn this paper is described a purely software technique allowing to detect SEUs...
Embedded systems are increasingly deployed in harsh environments that their components were not nece...