Synthesis of a 8051-like microcontroller tolerant to transient faults

International audienceThis paper presents fault-detection and correction techniques used to obtain a version of the 8051 microcontroller, so that it becomes robust with respect to a particular fault type: the transient modification of memory cells contents, so-called upsets or bitfits. A specific study regarding these issues was developed in an 8051 VHDL description synthesized in a FPGA environment. Preliminary results of a fault injection experiment are presented to validate the approach