Noise measurements were performed to determine the quality factor Q and the resonating frequency shift as a function of gas pressure P for microcantilevers with modified surfaces and geometries. In the molecular and continuum regimes, energy loss is dominated by the surrounding fluid leading to reduction of the Q factor and shift of the resonance frequency by Delta f, which becomes significant in the continuum regime showing sensitivity on surface changes. This is shown via three methods: frequency shift Delta f vs. P, Q factor vs. P, and direct calculation using surface roughness details acquired via atomic force microscopy. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.4744951
The author investigates quantitatively the influence of random surface roughness on the quality fact...
The author investigates quantitatively the influence of random surface roughness on the quality fact...
International audienceWe measure the mechanical thermal noise of soft silicon atomic force microscop...
Noise measurements were performed to determine the quality factor Q and the resonating frequency shi...
Noise measurements were performed to determine the quality factor Q and the resonating frequency shi...
Noise measurements were performed to determine the quality factor Q and the resonating frequency shi...
Noise measurements were performed to determine the quality factor Q and the resonating frequency shi...
Noise measurements were performed to determine the quality factor Q and the resonating frequency shi...
Noise measurements were performed to determine the quality factor ( Q) as a function of gas pressure...
We performed noise measurements to obtain the quality factor (Q) and frequency shift of gold coated ...
We performed noise measurements to obtain the quality factor (Q) and frequency shift of gold coated ...
We performed noise measurements to obtain the quality factor (Q) and frequency shift of gold coated ...
We performed noise measurements to obtain the quality factor (Q) and frequency shift of gold coated ...
We performed noise measurements to obtain the quality factor (Q) and frequency shift of gold coated ...
The author investigates quantitatively the influence of random surface roughness on the quality fact...
The author investigates quantitatively the influence of random surface roughness on the quality fact...
The author investigates quantitatively the influence of random surface roughness on the quality fact...
International audienceWe measure the mechanical thermal noise of soft silicon atomic force microscop...
Noise measurements were performed to determine the quality factor Q and the resonating frequency shi...
Noise measurements were performed to determine the quality factor Q and the resonating frequency shi...
Noise measurements were performed to determine the quality factor Q and the resonating frequency shi...
Noise measurements were performed to determine the quality factor Q and the resonating frequency shi...
Noise measurements were performed to determine the quality factor Q and the resonating frequency shi...
Noise measurements were performed to determine the quality factor ( Q) as a function of gas pressure...
We performed noise measurements to obtain the quality factor (Q) and frequency shift of gold coated ...
We performed noise measurements to obtain the quality factor (Q) and frequency shift of gold coated ...
We performed noise measurements to obtain the quality factor (Q) and frequency shift of gold coated ...
We performed noise measurements to obtain the quality factor (Q) and frequency shift of gold coated ...
We performed noise measurements to obtain the quality factor (Q) and frequency shift of gold coated ...
The author investigates quantitatively the influence of random surface roughness on the quality fact...
The author investigates quantitatively the influence of random surface roughness on the quality fact...
The author investigates quantitatively the influence of random surface roughness on the quality fact...
International audienceWe measure the mechanical thermal noise of soft silicon atomic force microscop...