Technology for nanoelectronic devices based on ultra-high vacuum scanning tunneling microscopy on the Si(100) surface

Scanning tunneling microscopy and spectroscopy of nanometer scale metallic features on silicon surfaces

Ye, Wei

May 2011

Nanometer scale metals are of great interest due to their potential applications in the future of mo...

Atomically controlled device fabrication using STM

Ruess, Frank Joachim, Physics, Faculty of Science, UNSW

January 2006

We present the development of a novel, UHV-compatible device fabrication strategy for the realisatio...

Toward atomic-scale device fabrication in silicon using scanning probe microscope

Frank J. Ruess
Lars Oberbeck
Michelle Y. Simmons
Kuan Eng
J. Goh
Alex R. Hamilton
Toby Hallam
Steven R. Schofield
Neil J. Curson
Robert G. Clark

January 1969

We present a complete fabrication process for the creation of robust nano-and atomic-scale devices i...

Technology for nanoelectronic devices based on ultra-high vacuum scanning tunneling microscopy on the Si(100) surface

Palasantzas, G
Ilge, B
Rogge, S
Geerlings, LJ

May 1999

We describe two process steps in an STM-based fabrication technology for nanoelectronic devices. Fir...

Technology for nanoelectronic devices based on ultra-high vacuum scanning tunneling microscopy on the Si(100) surface

Palasantzas, G
Ilge, B
Rogge, S
Geerlings, LJ

May 1999

We describe two process steps in an STM-based fabrication technology for nanoelectronic devices. Fir...

Technology for nanoelectronic devices based on ultra-high vacuum scanning tunneling microscopy on the Si(100) surface

Palasantzas, G
Ilge, B
Rogge, S
Geerlings, LJ

May 1999

We describe two process steps in an STM-based fabrication technology for nanoelectronic devices. Fir...

Fabrication of Co/Si nanowires by ultrahigh-vacuum scanning tunneling microscopy on hydrogen-passivated Si(100) surfaces

Palasantzas, G.
Ilge, B.
de Nijs, J.
Geerligs, L. J.

February 1999

We have fabricated nanometer width Co/Si metal lines on Si(100) surfaces by ultrahigh-vacuum scannin...

Fabrication of Co/Si nanowires by ultrahigh-vacuum scanning tunneling microscopy on hydrogen-passivated Si(100) surfaces

Palasantzas, G.
Ilge, B.
de Nijs, J.
Geerligs, L. J.

February 1999

We have fabricated nanometer width Co/Si metal lines on Si(100) surfaces by ultrahigh-vacuum scannin...

Fabrication of Co/Si nanowires by ultrahigh-vacuum scanning tunneling microscopy on hydrogen-passivated Si(100) surfaces

Palasantzas, G.
Ilge, B.
de Nijs, J.
Geerligs, L. J.

February 1999

We have fabricated nanometer width Co/Si metal lines on Si(100) surfaces by ultrahigh-vacuum scannin...

Fabrication of Co/Si nanowires by ultrahigh-vacuum scanning tunneling microscopy on hydrogen-passivated Si(100) surfaces

Palasantzas, G.
Ilge, B.
de Nijs, J.
Geerligs, L. J.

February 1999

We have fabricated nanometer width Co/Si metal lines on Si(100) surfaces by ultrahigh-vacuum scannin...

Fabrication of Co/Si nanowires by ultrahigh-vacuum scanning tunneling microscopy on hydrogen-passivated Si(100) surfaces

Nijs, J. De,
Ilge, B.,
Palasantzas, G.,
Geerligs, L.J.,

January 1999

We have fabricated nanometer width Co/Si metal lines on Si(100) surfaces by ultrahigh-vacuum scannin...

Fabrication of Co/Si nanowires by ultrahigh-vacuum scanning tunneling microscopy on hydrogen-passivated Si(100) surfaces

Palasantzas, G.
Ilge, B.
de Nijs, J.
Geerligs, L. J.

February 1999

We have fabricated nanometer width Co/Si metal lines on Si(100) surfaces by ultrahigh-vacuum scannin...

Nanofabrication on engineered silicon (100) surfaces using scanning probe microscopy

Li, Kai

January 2011

Fabricating and measuring sub-5 nanometer features brings to light several pressing issues in future...

Silicon-Based Molecular Nanotechnology: Fabrication and Characterization With the Scanning Tunneling Microscope

Hersam, Mark Christopher

135 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 2000.The importance of molecular n...

Silicon-Based Molecular Nanotechnology: Fabrication and Characterization With the Scanning Tunneling Microscope

Hersam, Mark Christopher

January 10000

135 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 2000.The importance of molecular n...

Scanning tunneling microscopy and spectroscopy of nanometer scale metallic features on silicon surfaces

Ye, Wei

May 2011

Nanometer scale metals are of great interest due to their potential applications in the future of mo...

Atomically controlled device fabrication using STM

Ruess, Frank Joachim, Physics, Faculty of Science, UNSW

January 2006

We present the development of a novel, UHV-compatible device fabrication strategy for the realisatio...

Toward atomic-scale device fabrication in silicon using scanning probe microscope

Frank J. Ruess
Lars Oberbeck
Michelle Y. Simmons
Kuan Eng
J. Goh
Alex R. Hamilton
Toby Hallam
Steven R. Schofield
Neil J. Curson
Robert G. Clark

January 1969

We present a complete fabrication process for the creation of robust nano-and atomic-scale devices i...

Technology for nanoelectronic devices based on ultra-high vacuum scanning tunneling microscopy on the Si(100) surface

Palasantzas, G
Ilge, B
Rogge, S
Geerlings, LJ

May 1999

We describe two process steps in an STM-based fabrication technology for nanoelectronic devices. Fir...

Technology for nanoelectronic devices based on ultra-high vacuum scanning tunneling microscopy on the Si(100) surface

Palasantzas, G
Ilge, B
Rogge, S
Geerlings, LJ

May 1999

We describe two process steps in an STM-based fabrication technology for nanoelectronic devices. Fir...

Technology for nanoelectronic devices based on ultra-high vacuum scanning tunneling microscopy on the Si(100) surface

Palasantzas, G
Ilge, B
Rogge, S
Geerlings, LJ

May 1999

We describe two process steps in an STM-based fabrication technology for nanoelectronic devices. Fir...

Fabrication of Co/Si nanowires by ultrahigh-vacuum scanning tunneling microscopy on hydrogen-passivated Si(100) surfaces

Palasantzas, G.
Ilge, B.
de Nijs, J.
Geerligs, L. J.

February 1999

We have fabricated nanometer width Co/Si metal lines on Si(100) surfaces by ultrahigh-vacuum scannin...

Fabrication of Co/Si nanowires by ultrahigh-vacuum scanning tunneling microscopy on hydrogen-passivated Si(100) surfaces

Palasantzas, G.
Ilge, B.
de Nijs, J.
Geerligs, L. J.

February 1999

We have fabricated nanometer width Co/Si metal lines on Si(100) surfaces by ultrahigh-vacuum scannin...

Fabrication of Co/Si nanowires by ultrahigh-vacuum scanning tunneling microscopy on hydrogen-passivated Si(100) surfaces

Palasantzas, G.
Ilge, B.
de Nijs, J.
Geerligs, L. J.

February 1999

We have fabricated nanometer width Co/Si metal lines on Si(100) surfaces by ultrahigh-vacuum scannin...

Fabrication of Co/Si nanowires by ultrahigh-vacuum scanning tunneling microscopy on hydrogen-passivated Si(100) surfaces

Palasantzas, G.
Ilge, B.
de Nijs, J.
Geerligs, L. J.

February 1999

We have fabricated nanometer width Co/Si metal lines on Si(100) surfaces by ultrahigh-vacuum scannin...

Fabrication of Co/Si nanowires by ultrahigh-vacuum scanning tunneling microscopy on hydrogen-passivated Si(100) surfaces

Nijs, J. De,
Ilge, B.,
Palasantzas, G.,
Geerligs, L.J.,

January 1999

We have fabricated nanometer width Co/Si metal lines on Si(100) surfaces by ultrahigh-vacuum scannin...

Fabrication of Co/Si nanowires by ultrahigh-vacuum scanning tunneling microscopy on hydrogen-passivated Si(100) surfaces

Palasantzas, G.
Ilge, B.
de Nijs, J.
Geerligs, L. J.

February 1999

We have fabricated nanometer width Co/Si metal lines on Si(100) surfaces by ultrahigh-vacuum scannin...

Nanofabrication on engineered silicon (100) surfaces using scanning probe microscopy

Li, Kai

January 2011

Fabricating and measuring sub-5 nanometer features brings to light several pressing issues in future...

Silicon-Based Molecular Nanotechnology: Fabrication and Characterization With the Scanning Tunneling Microscope

Hersam, Mark Christopher

135 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 2000.The importance of molecular n...

Silicon-Based Molecular Nanotechnology: Fabrication and Characterization With the Scanning Tunneling Microscope

Hersam, Mark Christopher

January 10000

135 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 2000.The importance of molecular n...

Scanning tunneling microscopy and spectroscopy of nanometer scale metallic features on silicon surfaces

Ye, Wei

May 2011

Nanometer scale metals are of great interest due to their potential applications in the future of mo...

Atomically controlled device fabrication using STM

Ruess, Frank Joachim, Physics, Faculty of Science, UNSW

January 2006

We present the development of a novel, UHV-compatible device fabrication strategy for the realisatio...

Toward atomic-scale device fabrication in silicon using scanning probe microscope

Frank J. Ruess
Lars Oberbeck
Michelle Y. Simmons
Kuan Eng
J. Goh
Alex R. Hamilton
Toby Hallam
Steven R. Schofield
Neil J. Curson
Robert G. Clark

January 1969

We present a complete fabrication process for the creation of robust nano-and atomic-scale devices i...

Technology for nanoelectronic devices based on ultra-high vacuum scanning tunneling microscopy on the Si(100) surface

Abstract

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Technology for nanoelectronic devices based on ultra-high vacuum scanning tunneling microscopy on the Si(100) surface

Abstract

Extracted data

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