textThis dissertation presents three studies discussing silicon nanoparticle deposition on two dielectric surfaces: silicon dioxode and silicon nitride. Attention is focused on growth of nanoparticles with a high areal density (1012 cm -2) and uniform size (~5 nm) for use as discrete charge storage elements in flash memory. Where possible, mechanisms that underlie nanoparticle formation and growth are revealed, and a model depicting the evolution of nanoparticle populations is presented. In the first study, the role of surface bound silicon adatoms is explored through quantitative surface seeding experiments. Disilane is cracked on a hot tungsten filament, liberating hydrogen gas and atomic silicon at a predictable and controllab...
International audienceWe present first results combining models at continuum and atomistic (DFT, Den...
The confinement of the modern day semiconductor devices is fast propelling the growth of nanoparticl...
Silicon nanoparticle-based floating gate metal-oxide-semiconductor (MOS) field effect devices have p...
textThis dissertation presents three studies discussing silicon nanoparticle deposition on two diel...
Abstract Selective silicon nanoparticle deposition from disilane on $17 nm diameter Si 3 N 4 feature...
Surface chemistry and nanoparticle growth relevant for flash memory applications has been investiga...
textThis dissertation describes the development of a process for the precise positioning of semicond...
textThis dissertation describes the development of a process for the precise positioning of semicond...
A multi-scale model has been developed in order to represent the nucleation and growth phenomena tak...
We present first results combining models at continuum and atomistic (DFT, Density Functional Theo...
A modeling study is presented involving calculations at continuum and atomistic (DFT, Density Functi...
International audienceA modeling study is presented involving calculations at continuum and atomisti...
International audienceWe present first results combining models at continuum and atomistic (DFT, Den...
International audienceWe present first results combining models at continuum and atomistic (DFT, Den...
Using the Computational Fluid Dynamics code Fluent, a simulation model of an industrial Low Pressure...
International audienceWe present first results combining models at continuum and atomistic (DFT, Den...
The confinement of the modern day semiconductor devices is fast propelling the growth of nanoparticl...
Silicon nanoparticle-based floating gate metal-oxide-semiconductor (MOS) field effect devices have p...
textThis dissertation presents three studies discussing silicon nanoparticle deposition on two diel...
Abstract Selective silicon nanoparticle deposition from disilane on $17 nm diameter Si 3 N 4 feature...
Surface chemistry and nanoparticle growth relevant for flash memory applications has been investiga...
textThis dissertation describes the development of a process for the precise positioning of semicond...
textThis dissertation describes the development of a process for the precise positioning of semicond...
A multi-scale model has been developed in order to represent the nucleation and growth phenomena tak...
We present first results combining models at continuum and atomistic (DFT, Density Functional Theo...
A modeling study is presented involving calculations at continuum and atomistic (DFT, Density Functi...
International audienceA modeling study is presented involving calculations at continuum and atomisti...
International audienceWe present first results combining models at continuum and atomistic (DFT, Den...
International audienceWe present first results combining models at continuum and atomistic (DFT, Den...
Using the Computational Fluid Dynamics code Fluent, a simulation model of an industrial Low Pressure...
International audienceWe present first results combining models at continuum and atomistic (DFT, Den...
The confinement of the modern day semiconductor devices is fast propelling the growth of nanoparticl...
Silicon nanoparticle-based floating gate metal-oxide-semiconductor (MOS) field effect devices have p...