Piezoresponse force microscopy characterization of PTO thin films

The piezoelectric properties of PbTiO3 thin films grown by pulsed laser deposition are investigated with piezoresponse force microscopy and transmission electron microscopy. The asgrown films exhibit upward polarization, and inhomogeneous distribution of piezoelectric characteristics. The data obtained reveal imprint during piezoresponse force microscopy measurements, nonlinearity in the piezoelectric deformation, and limited retention loss. Moreover, transmission electron microscopy shows the presence of defects near the film/substrate interface, which can be associated with the variations of piezoelectric properties.