Grain/phase boundaries contribute significantly to build up of residual stresses, owing to varied plastic/thermal response of different grain orientations or phases during thermomechanical treatment. Hence, accurate quantification of such local scale stress gradients in commercial components is important in understanding their mechanical performance. The current work introduces a correlative method utilizing Electron Back Scattered Diffraction and Focused Ion Beam-Digital Image slit milling methodology to accurately determine spatially resolved stress profiles in the vicinity of grain boundaries using commercially pure titanium as a model material. Measured local stress gradients were in good agreement with local misorientation values. The ...
The current work implements a correlative microscopy method utilizing electron back scatter diffract...
The current work implements a correlative microscopy method utilizing electron back scatter diffract...
The current work implements a correlative microscopy method utilizing electron back scatter diffract...
Grain/phase boundaries contribute significantly to build up of residual stresses, owing to varied pl...
Grain/phase boundaries contribute significantly to build up of residual stresses, owing to varied pl...
Grain/phase boundaries contribute significantly to build up of residual stresses, owing to varied pl...
Grain/phase boundaries contribute significantly to build up of residual stresses, owing to varied pl...
A correlative method based on electron back scattered diffraction and focused ion-beam-digital image...
A correlative method based on electron back scattered diffraction and focused ion-beam-digital image...
A correlative method based on electron back scattered diffraction and focused ion-beam-digital image...
A correlative method based on electron back scattered diffraction and focused ion-beam-digital image...
A correlative method based on electron back scattered diffraction and focused ion-beam-digital image...
A correlative method based on electron back scattered diffraction and focused ion-beam-digital image...
The current work implements a correlative microscopy method utilizing electron back scatter diffract...
The current work implements a correlative microscopy method utilizing electron back scatter diffract...
The current work implements a correlative microscopy method utilizing electron back scatter diffract...
The current work implements a correlative microscopy method utilizing electron back scatter diffract...
The current work implements a correlative microscopy method utilizing electron back scatter diffract...
Grain/phase boundaries contribute significantly to build up of residual stresses, owing to varied pl...
Grain/phase boundaries contribute significantly to build up of residual stresses, owing to varied pl...
Grain/phase boundaries contribute significantly to build up of residual stresses, owing to varied pl...
Grain/phase boundaries contribute significantly to build up of residual stresses, owing to varied pl...
A correlative method based on electron back scattered diffraction and focused ion-beam-digital image...
A correlative method based on electron back scattered diffraction and focused ion-beam-digital image...
A correlative method based on electron back scattered diffraction and focused ion-beam-digital image...
A correlative method based on electron back scattered diffraction and focused ion-beam-digital image...
A correlative method based on electron back scattered diffraction and focused ion-beam-digital image...
A correlative method based on electron back scattered diffraction and focused ion-beam-digital image...
The current work implements a correlative microscopy method utilizing electron back scatter diffract...
The current work implements a correlative microscopy method utilizing electron back scatter diffract...
The current work implements a correlative microscopy method utilizing electron back scatter diffract...
The current work implements a correlative microscopy method utilizing electron back scatter diffract...
The current work implements a correlative microscopy method utilizing electron back scatter diffract...