The current-voltage characteristics of the niobium - aluminum oxide - niobium tunnel junctions have been studied systematically and are compared with numerical simulations based on the microscopic theory of the proximity effect. The thickness of the base niobium layer is varied from 35 to 500 mn while the thickness of the aluminum layer is kept constant (about 9 mm). In a separate series of experiments the aluminum thickness is varied from 2 to 30 mn for two fixed thickness of the base electrode: 50 and 200 mn. The appropriate conditions for a full suppression of the so called "knee" structure at the gap voltage in the current-voltage characteristic are experimentally determined and theoretically interpreted in the framework of the microsco...
A microscopic theory is developed for structures S-N-N' (S is a superconductor, N, N' are normal met...
We present experimental results concerning both the fabrication and characterization of superconduct...
The electrical characteristics of thin film niobium, and tunnel junctions formed between thin-film ...
The current-voltage characteristics of the niobium - aluminum oxide - niobium tunnel junctions have ...
Nous avons fabriqué des jonctions tunnel multi-réseaux dans lesquelles l'électrode de base est un al...
The transparency of the tunnel barriers in double-barrier junctions influences the critical current ...
We have fabricated Nb/AlOX/Nb Josephson tunnel junctions using a sputtering apparatus with a load-lo...
We have performed transport measurements on Al and Nb based metal-oxide-metal tunnel junctions with ...
Regions with reduced energy gap induced by the proximity effect give rise to quasi-particle loss in ...
Abstract--Regions with reduced energy gap induced by the proximity effect give rise to quasi-particl...
In this paper, we study the effect of the tunnel barrier thickness non-uniformity in Nb/Al-AlOx/Nb t...
An analysis is made of current-voltage characteristics of superconductor-insulatormetal-insulator-su...
Results are reported for two related projects: the examination of material stability of plasma oxidi...
Nous avons étudié l'effet de proximité dans les bilames Al/Pb par effet tunnel et effet Josephson da...
Three types of Josephson tunnel junctions, standard Nb/Al,AlOx/Nb, symmetric Nb/Al,AlOx/Al/Nb, and N...
A microscopic theory is developed for structures S-N-N' (S is a superconductor, N, N' are normal met...
We present experimental results concerning both the fabrication and characterization of superconduct...
The electrical characteristics of thin film niobium, and tunnel junctions formed between thin-film ...
The current-voltage characteristics of the niobium - aluminum oxide - niobium tunnel junctions have ...
Nous avons fabriqué des jonctions tunnel multi-réseaux dans lesquelles l'électrode de base est un al...
The transparency of the tunnel barriers in double-barrier junctions influences the critical current ...
We have fabricated Nb/AlOX/Nb Josephson tunnel junctions using a sputtering apparatus with a load-lo...
We have performed transport measurements on Al and Nb based metal-oxide-metal tunnel junctions with ...
Regions with reduced energy gap induced by the proximity effect give rise to quasi-particle loss in ...
Abstract--Regions with reduced energy gap induced by the proximity effect give rise to quasi-particl...
In this paper, we study the effect of the tunnel barrier thickness non-uniformity in Nb/Al-AlOx/Nb t...
An analysis is made of current-voltage characteristics of superconductor-insulatormetal-insulator-su...
Results are reported for two related projects: the examination of material stability of plasma oxidi...
Nous avons étudié l'effet de proximité dans les bilames Al/Pb par effet tunnel et effet Josephson da...
Three types of Josephson tunnel junctions, standard Nb/Al,AlOx/Nb, symmetric Nb/Al,AlOx/Al/Nb, and N...
A microscopic theory is developed for structures S-N-N' (S is a superconductor, N, N' are normal met...
We present experimental results concerning both the fabrication and characterization of superconduct...
The electrical characteristics of thin film niobium, and tunnel junctions formed between thin-film ...