The widespread use of embedded mixed-signal cores in system-on-chip (SoC) or System-on-Package (SoP) design has been increasingly important in cost-effective manufacturing test for mixed-signal devices. A typical SoP encapsulates many of its internal functions, and its production test is performed by application of test signals to the SoP under control of external Automatic Test Equipment (ATE). However it is a problem that the external ATE does not have direct access to all the internal embedded functions of the SoP. Thus a classical test approach to SoP suffers from limited controllability and observability of its subsystems. Built-in Self-Test (BIST) and Built-off Self-test (BOST) schemes have been suggested and developed to overcome the...
High-performance analog and mixed-signal integrated circuits are integral parts of today\u27s and fu...
Design-for-test (DfT) circuitry that employs differential terminals inherently suffers from an imbal...
On chip Built In Self Test (BIST) is a cost-effective test methodology for highly complex VLSI devic...
The widespread use of embedded mixed-signal cores in system-on-chip (SoC) or System-on-Package (SoP)...
Recent advances in semiconductor technologies enable the integration of previously disparate designs...
ISBN : 978-2-11-129254-3The integration capabilities offered by current nanoscale CMOS technologies ...
The conventional analog and mixed-signal production testing of system-on-a-chip systems provides lim...
Built-In Self-Test (BIST) is a method of designing and creating an electronic chip or an electronic ...
Long test times and the use of conventional automatic test equipment (ATE) makes conventional mixed-...
Consumers are demanding more and more value for each dollar spent on new electronic equipment. Built...
textAnalog and mixed signal device testing is resource intensive due to the spectral and temporal sp...
Built-In Self-Test (BIST) offers a system the ability to test itself. Though it introduces inevitabl...
A formal set of design decisions can aid in using oscillation-based test (OBT) for analog subsystems...
textConventionally, the performances of Analog and Mixed-Signal (AMS) circuits have been characteri...
xii, 96 leaves : ill. ; 30 cm.PolyU Library Call No.: [THS] LG51 .H577M EIE 2003 KoThree built-in se...
High-performance analog and mixed-signal integrated circuits are integral parts of today\u27s and fu...
Design-for-test (DfT) circuitry that employs differential terminals inherently suffers from an imbal...
On chip Built In Self Test (BIST) is a cost-effective test methodology for highly complex VLSI devic...
The widespread use of embedded mixed-signal cores in system-on-chip (SoC) or System-on-Package (SoP)...
Recent advances in semiconductor technologies enable the integration of previously disparate designs...
ISBN : 978-2-11-129254-3The integration capabilities offered by current nanoscale CMOS technologies ...
The conventional analog and mixed-signal production testing of system-on-a-chip systems provides lim...
Built-In Self-Test (BIST) is a method of designing and creating an electronic chip or an electronic ...
Long test times and the use of conventional automatic test equipment (ATE) makes conventional mixed-...
Consumers are demanding more and more value for each dollar spent on new electronic equipment. Built...
textAnalog and mixed signal device testing is resource intensive due to the spectral and temporal sp...
Built-In Self-Test (BIST) offers a system the ability to test itself. Though it introduces inevitabl...
A formal set of design decisions can aid in using oscillation-based test (OBT) for analog subsystems...
textConventionally, the performances of Analog and Mixed-Signal (AMS) circuits have been characteri...
xii, 96 leaves : ill. ; 30 cm.PolyU Library Call No.: [THS] LG51 .H577M EIE 2003 KoThree built-in se...
High-performance analog and mixed-signal integrated circuits are integral parts of today\u27s and fu...
Design-for-test (DfT) circuitry that employs differential terminals inherently suffers from an imbal...
On chip Built In Self Test (BIST) is a cost-effective test methodology for highly complex VLSI devic...