The calculation results of the influence of interface state parameters on capacitance-voltage and conductance-voltage characteristics of n-GaAs metal insulator semiconductor structures are presented. The U-shaped distribution in the energy dimension and Gaussian-like distribution in the space dimension for insulator-semiconductor interface states are assumed
A new theory of the interface capacitance at metal-semiconductor junctions is presented. The diode c...
The algorithm is suggested for calculating the I–V characteristics of a voltage- or current-controll...
Information on localized states at the interfaces of solution-processed organic semiconductors and p...
The authors apply the conductance method at 25 and 150 °C to GaAs–Al₂O₃ metal-oxide-semiconductor de...
The current-voltage (I-V) and capacitance-voltage (C-V) characteristics of Au/n-GaAs Schottky diodes...
The metal-insulator or metal-amorphous semiconductor blocking contact is still not well understood. ...
A simple model is developed for the admittance of a metal-insulator-semiconductor (MIS) capacitor wh...
The authors model the capacitance-voltage (CV) behavior of In0.53Ga0.47As metal-oxide-semiconductor ...
The current–voltage (I–V) and capacitance–voltage (C–V) characteristics of Au/n-GaAs Schottky diodes...
A theoretical model for evaluating experimental capacitance —voltage curves on narrow — gap semicond...
Low frequency admittance measurements are used to determine the density of interface states in metal...
A theoretical model for evaluating experimental capacitance —voltage curves on narrow — gap semicond...
An accurate way of determining the series resistance R(s) of Schottky Barrier Diodes (SBDs) with and...
A study on parameters of the Sn/n-GaAs Schottky barrier diode (SBD) fabricated on an n-type GaAs sub...
By an analysis of the exchange of carriers through a semiconductor junction, a general relationship ...
A new theory of the interface capacitance at metal-semiconductor junctions is presented. The diode c...
The algorithm is suggested for calculating the I–V characteristics of a voltage- or current-controll...
Information on localized states at the interfaces of solution-processed organic semiconductors and p...
The authors apply the conductance method at 25 and 150 °C to GaAs–Al₂O₃ metal-oxide-semiconductor de...
The current-voltage (I-V) and capacitance-voltage (C-V) characteristics of Au/n-GaAs Schottky diodes...
The metal-insulator or metal-amorphous semiconductor blocking contact is still not well understood. ...
A simple model is developed for the admittance of a metal-insulator-semiconductor (MIS) capacitor wh...
The authors model the capacitance-voltage (CV) behavior of In0.53Ga0.47As metal-oxide-semiconductor ...
The current–voltage (I–V) and capacitance–voltage (C–V) characteristics of Au/n-GaAs Schottky diodes...
A theoretical model for evaluating experimental capacitance —voltage curves on narrow — gap semicond...
Low frequency admittance measurements are used to determine the density of interface states in metal...
A theoretical model for evaluating experimental capacitance —voltage curves on narrow — gap semicond...
An accurate way of determining the series resistance R(s) of Schottky Barrier Diodes (SBDs) with and...
A study on parameters of the Sn/n-GaAs Schottky barrier diode (SBD) fabricated on an n-type GaAs sub...
By an analysis of the exchange of carriers through a semiconductor junction, a general relationship ...
A new theory of the interface capacitance at metal-semiconductor junctions is presented. The diode c...
The algorithm is suggested for calculating the I–V characteristics of a voltage- or current-controll...
Information on localized states at the interfaces of solution-processed organic semiconductors and p...