Dielectric Material Significance on Common Mode Transient Immunity of a Shielded Pulse Planar Transformer

International audienceWide bandgap power switching device technologies earned immense superiority in power density converters in terms of higher switching frequency and efficiency attainments. However, this becomes opposing when utilized in planar pulse transformer-based gate driver applications, where rapid switching speeds originate electromagnetic disturbances due to the passage of common mode currents through the transformer’s stray capacitances. This paper will examine the common mode transient immunity (CMTI) of a shielded pulse planar transformer whilst examining the impact of dielectric material selection on the outcome result. The simulation methodology using Altium Designer and Ansys Q3D Extractor with dynamic links will be presented, in addition to agreeable experimental verifications