International audienceThe emission of electrons from an insulating crystal deposited on a conductor occurs at a macroscopic electric field of a few volts per micrometer, three orders of magnitude below the field emission from a clean metal. This is due to the local field enhancement induced by the presence of the insulating crystal. The emission profiles depend on the shape of the conductive substrate; analyzing these profiles enables the local difference in electric potential and the opening angleto be traced. Given the thickness of the crystal, the local difference in potential indicates the local field enhancement of a few volts per nanometer applied to the conductor
Summary: Progress in field emission theory from its original Fowler–Nordheim (FN) form is focused o...
Electrical conductance has been measured in-situ in two dimensions in the Ag/Si(111) system as a fun...
A statistical data analysis methodology was developed to evaluate the field emission properties of m...
International audienceThe emission of electrons from an insulating crystal deposited on a conductor ...
A study of field emission process in MEMS-based capacitor/switch-like geometries is presented. High ...
Contains fulltext : 92625.pdf (publisher's version ) (Open Access
A study of enhanced field emission on broad area niobium cathodes is presented. Emitting sites have ...
Direct experimental evidence of field emission currents in metallic MEMS devices is presented. For t...
In scanning field emission microscopy (SFEM), a tip (the source) is approached to few (or a few tens...
Herein, we describe a study of the phenomenon of field-induced electron emission from thin films dep...
ilms om on based materials which fall into this category are nanocrystal- equation which describes e...
Tunnelling probabilities in field emission processes are usually calculated assuming flat emitting s...
International audienceThe development of bright sources is allowing technological breakthroughs, esp...
Field emission from broad metal cathodes is known to be strongly enhanced at a small number of emitt...
In an attempt to clarify the behaviour of semi-conductor field emitters the properties of a narrow b...
Summary: Progress in field emission theory from its original Fowler–Nordheim (FN) form is focused o...
Electrical conductance has been measured in-situ in two dimensions in the Ag/Si(111) system as a fun...
A statistical data analysis methodology was developed to evaluate the field emission properties of m...
International audienceThe emission of electrons from an insulating crystal deposited on a conductor ...
A study of field emission process in MEMS-based capacitor/switch-like geometries is presented. High ...
Contains fulltext : 92625.pdf (publisher's version ) (Open Access
A study of enhanced field emission on broad area niobium cathodes is presented. Emitting sites have ...
Direct experimental evidence of field emission currents in metallic MEMS devices is presented. For t...
In scanning field emission microscopy (SFEM), a tip (the source) is approached to few (or a few tens...
Herein, we describe a study of the phenomenon of field-induced electron emission from thin films dep...
ilms om on based materials which fall into this category are nanocrystal- equation which describes e...
Tunnelling probabilities in field emission processes are usually calculated assuming flat emitting s...
International audienceThe development of bright sources is allowing technological breakthroughs, esp...
Field emission from broad metal cathodes is known to be strongly enhanced at a small number of emitt...
In an attempt to clarify the behaviour of semi-conductor field emitters the properties of a narrow b...
Summary: Progress in field emission theory from its original Fowler–Nordheim (FN) form is focused o...
Electrical conductance has been measured in-situ in two dimensions in the Ag/Si(111) system as a fun...
A statistical data analysis methodology was developed to evaluate the field emission properties of m...