Electron microprobe analysis and scanning electron microscopy in geology

This book describes electron microprobe analysis (EMPA) and scanning\ud electron microscopy (SEM) specifically from a geological viewpoint. No\ud prior knowledge is assumed and unnecessary technical detail is avoided, in\ud order to keep the book easily accessible to new users of these techniques.\ud The principles of electron–specimen interactions and instrumentation are\ud covered in the first part of the book. The mechanisms involved in SEM\ud (secondary and backscattered electron) image formation are then explained,\ud with full consideration of digital imaging techniques. The operating principles\ud of energy- and wavelength-dispersive X-ray spectrometers are described, as\ud well as ancillary techniques including cathodoluminescence (CL) and electron\ud backscatter diffraction (EBSD). Procedures for qualitative and quantitative\ud X-ray analysis (using either electron microprobe or SEM instruments) are\ud described in detail. The production of X-ray ‘maps’ showing element distributions\ud is also described, with examples. Finally the subject of specimen preparation\ud is discussed. There is an emphasis throughout on specifically\ud geological aspects not covered in books aimed at a more general readership.\ud This updated version of the first (1996) edition takes full account of recent\ud developments and is intended for geological graduate students and postdoctoral\ud workers, as well as those in commercial laboratories. It is also an invaluable\ud accompaniment to courses for geological EMPA and SEM users