Dependence of breakdown field on dielectric (interelectrode) thickness in base-metal electroded multilayer capacitors (3 pages)
- Milliken, A. D.
- Bell, A. J.
- Scott, J. F.
Publication date
March 2007
DOIAbstract
The authors have empirically determined the dependence of breakdown field EB versus dielectric thickness d (electrode separation) for a large number (4100) of BaTiO3-based multilayer capacitors with Ni base-metal electrodes. The data averaged over lateral area show for 6<d<22 µm that EB=const×d−n, where n=0.50±0.06, a result compatible with macroscopic “thermal” dc breakdown mechanisms. More precisely, however, the results nearly perfectly fit a situation of breakdown occurring in connected defects from collision ionization resulting from field emission from the cathode
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