The processes of electrochemical deposition into a matrix of vertical vias of different diameters (500–2000 nm) in Si/SiO2 substrates with a TiN barrier layer at the bottom of the holes are studied. Morpho- logical studies of the metal in the holes show that the structure of copper clusters is rather uniform and is formed from crystallites of ~30 to 50 nm. Repeatability and stability with a homogeneous structure and with holes filled 100% by Cu determine the prospect of using the Si/SiO2/Cu system as a basic element for creating three-dimensional micro- and nanostructures, as well as for the 3D assembly of IC crystals
Copper (Cu) electrodeposition (ECD) in through-silicon-vias (TSVs) is an essential technique require...
The purpose of this work was to study and analyze the effect of electrolyte temperature and anodiza...
abstract: This work demonstrates a capable reverse pulse deposition methodology to influence gap fil...
Through-silicon vias (TSV) will speed up interconnections between chips. Manufacturable and cost-eff...
Through-silicon vias (TSV) will speed up interconnections between chips. Manufacturable and cost-eff...
In the recent years, there has been a growing interest in micro- and nano-structured composite syste...
La miniaturisation nécessaire à l'accroissement des performances des composants microélectroniques e...
A microfabrication flow for Through Silicon Via (TSV), as one of the critical and enabling technolog...
Abstract-Two dimensional (2D) integration has been the tra-ditional approach for IC integration. Inc...
International audienceIn order to anticipate the further demands of miniaturization and integration ...
ABSTRACT In a three-dimensional (3D) packaging systems, the interconnections which penetrate stacked...
The motivation of this study is to provide answers to questions rising with 3D stacking of semicondu...
Les innovations issues du monde du semiconducteur évoluent vers de multiples applications et sont pr...
For 3D stacked flip chip packages, through silicon vias (TSVs) are employed as vertical interconnect...
Emerging innovative technologies from the semiconductor industry in other various industrials activi...
Copper (Cu) electrodeposition (ECD) in through-silicon-vias (TSVs) is an essential technique require...
The purpose of this work was to study and analyze the effect of electrolyte temperature and anodiza...
abstract: This work demonstrates a capable reverse pulse deposition methodology to influence gap fil...
Through-silicon vias (TSV) will speed up interconnections between chips. Manufacturable and cost-eff...
Through-silicon vias (TSV) will speed up interconnections between chips. Manufacturable and cost-eff...
In the recent years, there has been a growing interest in micro- and nano-structured composite syste...
La miniaturisation nécessaire à l'accroissement des performances des composants microélectroniques e...
A microfabrication flow for Through Silicon Via (TSV), as one of the critical and enabling technolog...
Abstract-Two dimensional (2D) integration has been the tra-ditional approach for IC integration. Inc...
International audienceIn order to anticipate the further demands of miniaturization and integration ...
ABSTRACT In a three-dimensional (3D) packaging systems, the interconnections which penetrate stacked...
The motivation of this study is to provide answers to questions rising with 3D stacking of semicondu...
Les innovations issues du monde du semiconducteur évoluent vers de multiples applications et sont pr...
For 3D stacked flip chip packages, through silicon vias (TSVs) are employed as vertical interconnect...
Emerging innovative technologies from the semiconductor industry in other various industrials activi...
Copper (Cu) electrodeposition (ECD) in through-silicon-vias (TSVs) is an essential technique require...
The purpose of this work was to study and analyze the effect of electrolyte temperature and anodiza...
abstract: This work demonstrates a capable reverse pulse deposition methodology to influence gap fil...