Quantifying the tip-sample interaction forces in amplitude-modulated atomic force microscopy (AM-AFM) has been an elusive yet important goal in nanoscale imaging, manipulation and spectroscopy using the AFM. In this paper we present a general theory for the reconstruction of tip-sample interaction forces using integral equations for AM-AFM and Chebyshev polynomial expansions. This allows us to reconstruct the tip-sample interactions using standard amplitude and phase versus distance curves acquired in AM-AFM regardless of tip oscillation amplitude and in both the net attractive and repulsive regimes of oscillation. Systematic experiments are performed to reconstruct interaction forces on polymer samples to demonstrate the power of the theor...
The quantification of the tip–sample interaction in amplitude modulation atomic force microscopy is ...
Wear is one of the main factors that hinders the performance of probes for atomic force microscopy (...
The origin of amplitude reduction in Tapping Mode Atomic Force Microscopy (TM-AFM) is typically attr...
The thermal movement of an atomic force microscope (AFM) tip is used to reconstruct the tip-surface ...
Wear is one of the main factors that hinders the performance of probes for atomic force microscopy (...
As one branch of atomic force microscopy (AFM), dynamic atomic force microscopy (Dynamic AFM) uses a...
Over the years atomic force microscopy has developed from a pure imaging technique to a tool that ca...
Over the years atomic force microscopy has developed from a pure imaging technique to a tool that ca...
Since its invention, the Atomic Force Microscope has emerged into one of the most useful tools innan...
Fast, accurate, and robust nanomechanical measurements are intensely studied in materials science, a...
\u3cp\u3eThe origin of amplitude reduction in Tapping Mode Atomic Force Microscopy (TM-AFM) is typic...
Wear is one of the main factors that hinders the performance of probes for atomic force microscopy (...
Various methods of force measurement with the Atomic Force Microscope (AFM) are compared for their a...
The origin of amplitude reduction in Tapping Mode Atomic Force Microscopy (TM-AFM) is typically attr...
Wear is one of the main factors that hinders the performance of probes for atomic force microscopy (...
The quantification of the tip–sample interaction in amplitude modulation atomic force microscopy is ...
Wear is one of the main factors that hinders the performance of probes for atomic force microscopy (...
The origin of amplitude reduction in Tapping Mode Atomic Force Microscopy (TM-AFM) is typically attr...
The thermal movement of an atomic force microscope (AFM) tip is used to reconstruct the tip-surface ...
Wear is one of the main factors that hinders the performance of probes for atomic force microscopy (...
As one branch of atomic force microscopy (AFM), dynamic atomic force microscopy (Dynamic AFM) uses a...
Over the years atomic force microscopy has developed from a pure imaging technique to a tool that ca...
Over the years atomic force microscopy has developed from a pure imaging technique to a tool that ca...
Since its invention, the Atomic Force Microscope has emerged into one of the most useful tools innan...
Fast, accurate, and robust nanomechanical measurements are intensely studied in materials science, a...
\u3cp\u3eThe origin of amplitude reduction in Tapping Mode Atomic Force Microscopy (TM-AFM) is typic...
Wear is one of the main factors that hinders the performance of probes for atomic force microscopy (...
Various methods of force measurement with the Atomic Force Microscope (AFM) are compared for their a...
The origin of amplitude reduction in Tapping Mode Atomic Force Microscopy (TM-AFM) is typically attr...
Wear is one of the main factors that hinders the performance of probes for atomic force microscopy (...
The quantification of the tip–sample interaction in amplitude modulation atomic force microscopy is ...
Wear is one of the main factors that hinders the performance of probes for atomic force microscopy (...
The origin of amplitude reduction in Tapping Mode Atomic Force Microscopy (TM-AFM) is typically attr...