Data that is either transmitted over communication channel (e.g.bus) or stored in memory is not completely error free. RAM memory cell contents can change spuriously due to some electromagnetic interference. In magnetic storage devices such as disks, magnetic flux density increases could cause one or more bits to flip (change that value). Exposure to high speed α ray particles is a prominent problem in all the semiconductor memories used for various communication applications. So, in this paper, an error detection and correction method to protect the RAM against the errors is proposed. This method is based on 2-d parities. The parity bits are calculated at the transmitter end for each row, column and diagonal in slash and backslash directio...
Present microsatellite experiments generate a significant amount of data. Microsatellite on-board co...
This senate proposes an optimize version of the Hamming codes for Error detection and correction (ED...
The likelihood of soft errors increases with system complexity, reduction in operational voltages, e...
Data that is either transmitted over communication channel (e.g.bus) or stored in memory is not comp...
As technology scaling increases computer memory’s bit-cell density and reduces the voltage of semico...
Several EDAC techniques have been proposed and employed to effectively detect and correct errors int...
International audienceIonizing radiation and electromagnetic interference (EMI) can cause single eve...
As technology scaling increases computer memory’s bit-cell density and reduces the voltage of semico...
Abstract — Nowadays, memories we use are cheap, easily available in market, compact, have high progr...
Abstract — The radiation in the space environment creates multiple upsets in the memories, when the ...
An important issue in the reliability of memories exposed to radiation environment is transient mult...
As memory technology scales, the demand for higher performance and reliable operation is increasing ...
As memory technology scales, the demand for higher performance and reliable operation is increasing ...
International audienceTwo error correction schemes are proposed for word-oriented binary memories th...
International audienceTwo error correction schemes are proposed for word-oriented binary memories th...
Present microsatellite experiments generate a significant amount of data. Microsatellite on-board co...
This senate proposes an optimize version of the Hamming codes for Error detection and correction (ED...
The likelihood of soft errors increases with system complexity, reduction in operational voltages, e...
Data that is either transmitted over communication channel (e.g.bus) or stored in memory is not comp...
As technology scaling increases computer memory’s bit-cell density and reduces the voltage of semico...
Several EDAC techniques have been proposed and employed to effectively detect and correct errors int...
International audienceIonizing radiation and electromagnetic interference (EMI) can cause single eve...
As technology scaling increases computer memory’s bit-cell density and reduces the voltage of semico...
Abstract — Nowadays, memories we use are cheap, easily available in market, compact, have high progr...
Abstract — The radiation in the space environment creates multiple upsets in the memories, when the ...
An important issue in the reliability of memories exposed to radiation environment is transient mult...
As memory technology scales, the demand for higher performance and reliable operation is increasing ...
As memory technology scales, the demand for higher performance and reliable operation is increasing ...
International audienceTwo error correction schemes are proposed for word-oriented binary memories th...
International audienceTwo error correction schemes are proposed for word-oriented binary memories th...
Present microsatellite experiments generate a significant amount of data. Microsatellite on-board co...
This senate proposes an optimize version of the Hamming codes for Error detection and correction (ED...
The likelihood of soft errors increases with system complexity, reduction in operational voltages, e...