The structural characteristics of polymer track-etched membranes (TM) were obtained by atomic force microscopy (AFM) for a set of samples (polypropylene, polycarbonate, polyethylene terephthalate, with average pore diameters ~183, 375, and 1430 nm, respectively). The analysis of AFM experimental data was performed by using a specially developed technique for computer analysis of AFM images. The method allows one to obtain such parameters of TM as distribution of pore diameters, distribution of the minimum distances between the nearest pores, pore surface density, as well as to identify defective pores. Spatial inhomogeneities in the distribution of pore parameters were revealed. No anisotropy (some specific selected direction) was found in ...
The atomic force microscope (AFM) was used to study a series of self-assembled systems: alkanethiol ...
Osmotically driven membrane processes (including forward osmosis (FO) and pressure retarded osmosis ...
Determination of the surface roughness by AFM is crucial to the study of particle fouling in nanofil...
© 2016, Pleiades Publishing, Ltd.The surface morphology of polymeric membranes as organic–inorganic ...
Atomic force microscopy (AFM) has a wide range of applications and is rapidly growing in research an...
Atomic Force Microscopy (AFM), a recently developed technique, has proved to be a specially useful t...
The thickness and roughness of the functional layer in thin film composite membranes (TFCMs) are imp...
roughness. In this study, the possibility of using an atomic force microscopy to analyse the surface...
Nanoporous particle track etched membranes with pore size ranging from 15 to 100 nm are prepared fro...
Coordenação de Aperfeiçoamento de Pessoal de Nível Superior (CAPES)Fundação de Amparo à Pesquisa do ...
The use of atomic force microscopy (AFM) has been increasingly used in recent years in academic rese...
AbstractThe capillary flow porometry (CFP) is generally used for measuring the bubble point pressure...
The structural features of a polymer electrolyte membrane (PEM), consisting of polystyrene sulfonic ...
The membrane distillation (MD) process is an emerging and under-developed technique, which is curren...
This work was supported by the RSF (project No. 18-19-00453) and the RFBR (project No. 18-08-01356 A...
The atomic force microscope (AFM) was used to study a series of self-assembled systems: alkanethiol ...
Osmotically driven membrane processes (including forward osmosis (FO) and pressure retarded osmosis ...
Determination of the surface roughness by AFM is crucial to the study of particle fouling in nanofil...
© 2016, Pleiades Publishing, Ltd.The surface morphology of polymeric membranes as organic–inorganic ...
Atomic force microscopy (AFM) has a wide range of applications and is rapidly growing in research an...
Atomic Force Microscopy (AFM), a recently developed technique, has proved to be a specially useful t...
The thickness and roughness of the functional layer in thin film composite membranes (TFCMs) are imp...
roughness. In this study, the possibility of using an atomic force microscopy to analyse the surface...
Nanoporous particle track etched membranes with pore size ranging from 15 to 100 nm are prepared fro...
Coordenação de Aperfeiçoamento de Pessoal de Nível Superior (CAPES)Fundação de Amparo à Pesquisa do ...
The use of atomic force microscopy (AFM) has been increasingly used in recent years in academic rese...
AbstractThe capillary flow porometry (CFP) is generally used for measuring the bubble point pressure...
The structural features of a polymer electrolyte membrane (PEM), consisting of polystyrene sulfonic ...
The membrane distillation (MD) process is an emerging and under-developed technique, which is curren...
This work was supported by the RSF (project No. 18-19-00453) and the RFBR (project No. 18-08-01356 A...
The atomic force microscope (AFM) was used to study a series of self-assembled systems: alkanethiol ...
Osmotically driven membrane processes (including forward osmosis (FO) and pressure retarded osmosis ...
Determination of the surface roughness by AFM is crucial to the study of particle fouling in nanofil...