Temperature and electric field dependence of the carrier emission processes in a quantum dot-based memory structure

This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. This article appeared in Appl. Phys. Lett. 94, 042108 (2009) and may be found at https://doi.org/10.1063/1.3076126.Hole emission processes from self-organized GaAs0.4Sb0.6/GaAs quantum dots embedded in a - diode are studied by capacitance-voltage spectroscopy. The method introduced allows the investigation of the temperature and electric field dependence of carrier emission with time constants from below nanoseconds up to thousands of seconds. Different emission processes are clearly distinguished, such as tunneling, phonon-assisted tunneling, and thermal activation, each important for quantum-dot-based memory structures. The erase time was determined to 1.5 ms for an electric field of about 200 kV/cm. At 500 kV/cm, 10 ns are predicted sufficient for fast erasing