Funding Information: Deutsche Forschungsgemeinschaft (SFB 688); NIH (Prime Grant No. 5 R01 DA038882-02); University of Wuerzburg.Microscopic imaging at high spatial-temporal resolution over long time scales (minutes to hours) requires rapid and precise stabilization of the microscope focus. Conventional and commercial autofocus systems are largely based on piezoelectric stages or mechanical objective actuators. Objective to sample distance is either measured by image analysis approaches or by hardware modules measuring the intensity of reflected infrared light. We propose here a truly all-optical microscope autofocus taking advantage of an electrically tunable lens and a totally internally reflected infrared probe beam. We implement a feedb...
With the rapid development of semiconductor technology the demand for high resolution measuring syst...
International audienceIn MEMS microassembly areas, different methods of automatic focusing are prese...
International audienceIn this paper, we present a full scale autofocus approach for scanning electro...
Funding Information: Deutsche Forschungsgemeinschaft (SFB 688); NIH (Prime Grant No. 5 R01 DA038882-...
Microscopic imaging at high spatial-temporal resolution over long time scales (minutes to hours) req...
Nowadays, autofocus is a fundamental feature of a lot of devices for different field of application....
This paper presents the use of a deformable mirror (DM) configured to rapidly refocus a microscope e...
This study designs and accomplishes a high precision and robust laser-based autofocusing system, in ...
We present a robust, long-range optical autofocus system for microscopy utilizing machine learning. ...
There are numerous situations in microscopy where it is desirable to remotely refocus a microscope e...
Electrically tunable lenses exhibit strong potential for fast motion-free axial scanning in a variet...
We present an image-based autofocusing system applied in nonlinear microscopy and spectro...
International audienceIn this paper, we present a full scale autofocus approach for scanning electro...
National Natural Science Foundation of China [61705092, 11647144, 31522056]; National Natural Scienc...
International audienceIn this paper, we present a full scale autofocus approach for scanning electro...
With the rapid development of semiconductor technology the demand for high resolution measuring syst...
International audienceIn MEMS microassembly areas, different methods of automatic focusing are prese...
International audienceIn this paper, we present a full scale autofocus approach for scanning electro...
Funding Information: Deutsche Forschungsgemeinschaft (SFB 688); NIH (Prime Grant No. 5 R01 DA038882-...
Microscopic imaging at high spatial-temporal resolution over long time scales (minutes to hours) req...
Nowadays, autofocus is a fundamental feature of a lot of devices for different field of application....
This paper presents the use of a deformable mirror (DM) configured to rapidly refocus a microscope e...
This study designs and accomplishes a high precision and robust laser-based autofocusing system, in ...
We present a robust, long-range optical autofocus system for microscopy utilizing machine learning. ...
There are numerous situations in microscopy where it is desirable to remotely refocus a microscope e...
Electrically tunable lenses exhibit strong potential for fast motion-free axial scanning in a variet...
We present an image-based autofocusing system applied in nonlinear microscopy and spectro...
International audienceIn this paper, we present a full scale autofocus approach for scanning electro...
National Natural Science Foundation of China [61705092, 11647144, 31522056]; National Natural Scienc...
International audienceIn this paper, we present a full scale autofocus approach for scanning electro...
With the rapid development of semiconductor technology the demand for high resolution measuring syst...
International audienceIn MEMS microassembly areas, different methods of automatic focusing are prese...
International audienceIn this paper, we present a full scale autofocus approach for scanning electro...