Achieving the desired optical response from a multilayer thin-film structure over a broad range of wavelengths and angles of incidence can be challenging. An advanced thin-film structure can consist of multiple materials with different thicknesses and numerous layers. Design and optimization of complex thin-film structures with multiple variables is a computationally heavy problem that is still under active research. To enable fast and easy experimentation with new optimization techniques, we propose the Python package TMM-Fast which enables parallelized computation of reflection and transmission of light at different angles of incidence and wavelengths through the multilayer thin-film. By decreasing computational time, generating datasets ...
International audienceDespite limiting the performance of multilayer optical thin-films, light scatt...
International audienceA novel computational methodology based on statistical learning multiobjective...
Input Data: These data files contain the spectral data, reflectance (R) and transmittance (T), and t...
Achieving the desired optical response from a multilayer thin-film structure over a broad range of w...
We present PyMoosh, a Python-based simulation library designed to provide a comprehensive set of num...
In this paper, we report a simple method to extract thickness and refractive index of thin-film from...
A graphical user interface was developed, allowing researchers and engineers to find thicknesses as ...
Engineering a physical system to feature designated characteristics states an inverse design problem...
Please note that this is a searchable PDF derived via optical character recognition (OCR) from the o...
The task of designing optical multilayer thin-films regarding a given target is currently solved usi...
The task of designing optical multilayer thin-films regarding a given target is currently solved usi...
© 2019 The Author(s). Published by IOP Publishing Ltd on behalf of the Institute of Physics and Deut...
Thesis: Ph. D., Massachusetts Institute of Technology, Department of Electrical Engineering and Comp...
A thin film is a layer of a material or an assembly of multilayers of different materials ranging fr...
Engineering and physical science often involve the design and manufacturing of physical devices. Con...
International audienceDespite limiting the performance of multilayer optical thin-films, light scatt...
International audienceA novel computational methodology based on statistical learning multiobjective...
Input Data: These data files contain the spectral data, reflectance (R) and transmittance (T), and t...
Achieving the desired optical response from a multilayer thin-film structure over a broad range of w...
We present PyMoosh, a Python-based simulation library designed to provide a comprehensive set of num...
In this paper, we report a simple method to extract thickness and refractive index of thin-film from...
A graphical user interface was developed, allowing researchers and engineers to find thicknesses as ...
Engineering a physical system to feature designated characteristics states an inverse design problem...
Please note that this is a searchable PDF derived via optical character recognition (OCR) from the o...
The task of designing optical multilayer thin-films regarding a given target is currently solved usi...
The task of designing optical multilayer thin-films regarding a given target is currently solved usi...
© 2019 The Author(s). Published by IOP Publishing Ltd on behalf of the Institute of Physics and Deut...
Thesis: Ph. D., Massachusetts Institute of Technology, Department of Electrical Engineering and Comp...
A thin film is a layer of a material or an assembly of multilayers of different materials ranging fr...
Engineering and physical science often involve the design and manufacturing of physical devices. Con...
International audienceDespite limiting the performance of multilayer optical thin-films, light scatt...
International audienceA novel computational methodology based on statistical learning multiobjective...
Input Data: These data files contain the spectral data, reflectance (R) and transmittance (T), and t...