An integrated software for calculating the major mechanical properties of materials was newly programmed. The material mechanical properties are determined from a peak position and the broadness of X-ray diffraction (XRD) line using profile function method, including Gaussian, Parabola, Half-width, and Centroid. The X-ray diffraction line in software is also corrected by the generalized X-ray absorption function. The results show that the precision coefficient (R2) of the dhkl-sin2 ψ linear regression depends on tested materials and the method of the 2θ determination. The Parabola and Gaussian methods show greater fitting accuracy in comparison to the other two methods in determining stress. The mechanical properties calculated using this s...
The X-ray diffraction method is arguably the most convenient method of measuring residual stresses i...
The X-ray diffraction method is arguably the most convenient method of measuring residual stresses i...
A brief theoretical development of x-ray diffraction residual stress measurement is presented emphas...
X-ray diffraction is an effective mean for analyzing material properties. This paper developed a new...
Computer programs have been developed (i) for least squares13; (ii) to refinement of the dimensions ...
Computer programs have been developed (i) for least squares13; (ii) to refinement of the dimensions ...
X-rays are invisible in nature but having more penetrating power compared to light was used by the p...
X-ray diffraction (XRD) is an important and widely used material characterization technique. With th...
X-ray diffraction (XRD) is the most powerful tool for non destructive study of the fine structure of...
(X-Ray Diffraction) is an old and widely used technique in studying the properties of crystals. In t...
This guide is applicable to X-ray stress measurements on crystalline materials. There is currently n...
X-ray stress analyses on crystalline or partially crystalline materials are based on the determinati...
X-ray stress analyses on crystalline or partially crystalline materials are based on the determinati...
X-ray stress analyses on crystalline or partially crystalline materials are based on the determinati...
The X-ray diffraction method is arguably the most convenient method of measuring residual stresses i...
The X-ray diffraction method is arguably the most convenient method of measuring residual stresses i...
The X-ray diffraction method is arguably the most convenient method of measuring residual stresses i...
A brief theoretical development of x-ray diffraction residual stress measurement is presented emphas...
X-ray diffraction is an effective mean for analyzing material properties. This paper developed a new...
Computer programs have been developed (i) for least squares13; (ii) to refinement of the dimensions ...
Computer programs have been developed (i) for least squares13; (ii) to refinement of the dimensions ...
X-rays are invisible in nature but having more penetrating power compared to light was used by the p...
X-ray diffraction (XRD) is an important and widely used material characterization technique. With th...
X-ray diffraction (XRD) is the most powerful tool for non destructive study of the fine structure of...
(X-Ray Diffraction) is an old and widely used technique in studying the properties of crystals. In t...
This guide is applicable to X-ray stress measurements on crystalline materials. There is currently n...
X-ray stress analyses on crystalline or partially crystalline materials are based on the determinati...
X-ray stress analyses on crystalline or partially crystalline materials are based on the determinati...
X-ray stress analyses on crystalline or partially crystalline materials are based on the determinati...
The X-ray diffraction method is arguably the most convenient method of measuring residual stresses i...
The X-ray diffraction method is arguably the most convenient method of measuring residual stresses i...
The X-ray diffraction method is arguably the most convenient method of measuring residual stresses i...
A brief theoretical development of x-ray diffraction residual stress measurement is presented emphas...