Winter Wheat Take-All Disease Index Estimation Model Based on Hyperspectral Data

Wheat take-all, caused by two variants of the fungus Gaeumannomyces gramnis (Sacc.) Arx & D. Olivier, was common in spring wheat areas in northwest and north China and occurred in winter wheat areas in north China. The yield of common disease areas was reduced by more than 20% and the yield of severe cases was reduced by more than 50%. Large-scale rapid and accurate estimation of the incidence of wheat take-all plays an important role in guiding field control and agricultural yield estimation. In this study, a portable ground spectrometer was used to collect the spectral reflectance in the 350–1050 nm band range of wheat canopy after take-all infection in the wheat grain filling stage and combined with the ground disease survey data.Then a winter wheat take-all disease index estimation model was proposed based on the spectral band division interval and selected band combination. According to the normalized difference spectral index (NDSI) and the determinative coefficient of the disease index formed by any two band combinations, the spectral index band combinations corresponding to the spectral index with high correlation in each region were screened by dividing spectral intervals. Partial least-squares regression was used to establish a binary and ternary disease index calibration model. The results showed that the model based on spectral indices of ternary variables had the highest coefficient of determination. Finally, the optimal regression model of wheat take-all disease condition index composed of NDSI(R590,R598), NDSI(R534,R742) and NDSI(R810,R834) was established: Y = 134.577 − 70.301 NDSI(R590,R598) − 223.533 NDSI(R534,R742) + 51.584 NDSI(R810,R834) (R2 = 0.743, RMSEP = 0.094, df = 15), which was the most suitable model for winter wheat take-all estimation. The construction of this model can provide new method and technical support for future evaluation and monitoring of wheat take-all disease on the field