Notes on the Extraction of Aspect-Independent Parameters of Chipless RFID Tags

International audienceThis paper presents the extraction of aspectindependent parameters for dual-L dipoles based chipless radio frequency (RF) identification (RFID) tags using spectrogram method using single measurement. The implemented spectrogram method is based on a single short-time Fourier transform (STFT) averaging window. The performance of the spectrogram method is compared to the matrix pencil method (MPM). A computational time comparison between the spectrogram method and MPM is presented. Index Terms-Chipless radio frequency (RF) identification (RFID), matrix pencil method (MPM), quality factor, short time Fourier transform (STFT)