10.1109/TCAD.2007.891036IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems263468-478ITCS
Soft error can be simplified as a disruption that occurred in the circuit. Soft error can cause a ...
「DAシンポジウム2010 : システムLSI設計技術とDA」2010年9月2日（木）～3日（金）にて発表された論文。ソフトエラー耐性を考慮した論理回路の設計では，ソフトエラー耐性評価手法が必要となる...
The Soft-Error (SE) reliability and the effects of Negative Bias Temperature Instability (NBTI) in d...
In recent years, soft errors happen in the combinational logic circuits that genuinely impact the ac...
Abstract — Accurate electrical masking modeling represents a significant challenge in soft error rat...
Single Event Upsets (SEU) arising from atmospheric neutrons and alpha particles are becoming increas...
We develop a simple model that computes the probability that a strike at the output of a gate has an...
Integrated circuits are getting increasingly vulnerable to soft errors; as a consequence, soft error...
In the last decade, the focus of fault-tolerance methods has tended towards circuit level modificati...
Soft errors due to cosmic rays cause reliability problems during lifetime operation of digital syste...
Due to reduction in device feature size and supply voltage, the sensitivity to radiation induced tra...
Alphapartikel, die durch natürliche radioaktive Verunreinigungen von Materialien zur Herstellung int...
In this paper we propose a method for error-correction in IC implementations of Boolean functions. T...
We present a soft error rate (SER) analysis methodology within a simulation and design environment t...
International audienceThe exponential dependence of the soft-error rate (SER) with critical charge i...
Soft error can be simplified as a disruption that occurred in the circuit. Soft error can cause a ...
「DAシンポジウム2010 : システムLSI設計技術とDA」2010年9月2日（木）～3日（金）にて発表された論文。ソフトエラー耐性を考慮した論理回路の設計では，ソフトエラー耐性評価手法が必要となる...
The Soft-Error (SE) reliability and the effects of Negative Bias Temperature Instability (NBTI) in d...
In recent years, soft errors happen in the combinational logic circuits that genuinely impact the ac...
Abstract — Accurate electrical masking modeling represents a significant challenge in soft error rat...
Single Event Upsets (SEU) arising from atmospheric neutrons and alpha particles are becoming increas...
We develop a simple model that computes the probability that a strike at the output of a gate has an...
Integrated circuits are getting increasingly vulnerable to soft errors; as a consequence, soft error...
In the last decade, the focus of fault-tolerance methods has tended towards circuit level modificati...
Soft errors due to cosmic rays cause reliability problems during lifetime operation of digital syste...
Due to reduction in device feature size and supply voltage, the sensitivity to radiation induced tra...
Alphapartikel, die durch natürliche radioaktive Verunreinigungen von Materialien zur Herstellung int...
In this paper we propose a method for error-correction in IC implementations of Boolean functions. T...
We present a soft error rate (SER) analysis methodology within a simulation and design environment t...
International audienceThe exponential dependence of the soft-error rate (SER) with critical charge i...
Soft error can be simplified as a disruption that occurred in the circuit. Soft error can cause a ...
「DAシンポジウム2010 : システムLSI設計技術とDA」2010年9月2日（木）～3日（金）にて発表された論文。ソフトエラー耐性を考慮した論理回路の設計では，ソフトエラー耐性評価手法が必要となる...
The Soft-Error (SE) reliability and the effects of Negative Bias Temperature Instability (NBTI) in d...
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