Pulsed laser processing of vacuum component surfaces is a promising method for electron cloud mitigation in particle accelerators. By generating a hierarchically structured surface, the escape probability of secondary electrons is reduced. The choice of laser treatment parameters – such as laser power, scanning speed and line distance – has an influence on the resulting surface morphology as well as on its performance. The impact of processing parameters on the surface properties of copper is investigated by Secondary Electron Yield (SEY) measurements, Scanning Electron Microscopy (SEM), ablation depth measurements in an optical microscope and particle release analysis. Independent of the laser wavelength (532nm and 1064nm), it was found th...
Secondary Electron Yield (SEY) [3, 5] occurs in a system when a primary electron impinges a material...
Secondary Electron Yield (SEY) [3, 5] occurs in a system when a primary electron impinges a material...
Secondary Electron Yield (SEY) [3, 5] occurs in a system when a primary electron impinges a material...
Electron multipacting and electron cloud have been identified as being the major limiting factors fo...
Electron multipacting and electron cloud have been identified as being the major limiting factors fo...
Developing a surface with low Secondary Electron Yield (SEY) is one of the main ways of mitigating e...
Developing a surface with low Secondary Electron Yield (SEY) is one of the main ways of mitigating e...
The electron-cloud phenomenon is one cause of beam instabilities in high intensity positive particle...
The electron-cloud phenomenon is one cause of beam instabilities in high intensity positive particle...
The electron-cloud phenomenon is one cause of beam instabilities in high intensity positive particle...
Secondary Electron Yield (SEY) [3, 5] occurs in a system when a primary electron impinges a material...
Secondary Electron Yield (SEY) [3, 5] occurs in a system when a primary electron impinges a material...
Secondary Electron Yield (SEY) [3, 5] occurs in a system when a primary electron impinges a material...
Secondary Electron Yield (SEY) [3, 5] occurs in a system when a primary electron impinges a material...
Secondary Electron Yield (SEY) [3, 5] occurs in a system when a primary electron impinges a material...
Secondary Electron Yield (SEY) [3, 5] occurs in a system when a primary electron impinges a material...
Secondary Electron Yield (SEY) [3, 5] occurs in a system when a primary electron impinges a material...
Secondary Electron Yield (SEY) [3, 5] occurs in a system when a primary electron impinges a material...
Electron multipacting and electron cloud have been identified as being the major limiting factors fo...
Electron multipacting and electron cloud have been identified as being the major limiting factors fo...
Developing a surface with low Secondary Electron Yield (SEY) is one of the main ways of mitigating e...
Developing a surface with low Secondary Electron Yield (SEY) is one of the main ways of mitigating e...
The electron-cloud phenomenon is one cause of beam instabilities in high intensity positive particle...
The electron-cloud phenomenon is one cause of beam instabilities in high intensity positive particle...
The electron-cloud phenomenon is one cause of beam instabilities in high intensity positive particle...
Secondary Electron Yield (SEY) [3, 5] occurs in a system when a primary electron impinges a material...
Secondary Electron Yield (SEY) [3, 5] occurs in a system when a primary electron impinges a material...
Secondary Electron Yield (SEY) [3, 5] occurs in a system when a primary electron impinges a material...
Secondary Electron Yield (SEY) [3, 5] occurs in a system when a primary electron impinges a material...
Secondary Electron Yield (SEY) [3, 5] occurs in a system when a primary electron impinges a material...
Secondary Electron Yield (SEY) [3, 5] occurs in a system when a primary electron impinges a material...
Secondary Electron Yield (SEY) [3, 5] occurs in a system when a primary electron impinges a material...
Secondary Electron Yield (SEY) [3, 5] occurs in a system when a primary electron impinges a material...