Publication date
January 2013
DOI Publisher
Institute of Electrical and Electronics Engineers (IEEE)Abstract
10.1109/VLSID.2013.192Proceedings of the IEEE International Conference on VLSI Design227-232PIVD
10.1109/VLSID.2013.192Proceedings of the IEEE International Conference on VLSI Design227-232PIVD
Modern generations of CMOS technology nodes are facing critical causes of hardware reliability failu...
Technology scaling has led to further processor integration, and future manycore chips will have mor...
Technology scaling has led to further processor integration, and future manycore chips will have mor...
92 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 2006.Overall, this dissertation lay...
Open data for: Duan, S., Zwolinski, M., & Halak, B. (2018). Lifetime Reliability-aware Digital ...
Open data for: Duan, S., Zwolinski, M., & Halak, B. (2018). Lifetime Reliability-aware Digital ...
Open data for: Duan, S., Zwolinski, M., & Halak, B. (2018). Lifetime Reliability-aware Digital ...
Meeting reliability targets with viable costs in the nanometer landscape become a significant challe...
Aggressive CMOS technology feature size down-scaling into the deca nanometer regime, while benefitin...
Aggressive CMOS technology feature size down-scaling into the deca nanometer regime, while benefitin...
Rapid device aging in the nano era threatens system lifetime reliability, posing a major intrinsic t...
In safety related applications and in products with long lifetimes reliability is a must. More...
This work concerns appropriate metrics for evaluating microarchitectural enhancements to improve pro...
Publisher Copyright: © 2013 IEEE.An expected lifetime of converters is of great importance for optim...
In nano-scale CMOS technology, circuit reliability is a growing concern for complicated digital circ...
Modern generations of CMOS technology nodes are facing critical causes of hardware reliability failu...
Technology scaling has led to further processor integration, and future manycore chips will have mor...
Technology scaling has led to further processor integration, and future manycore chips will have mor...
92 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 2006.Overall, this dissertation lay...
Open data for: Duan, S., Zwolinski, M., & Halak, B. (2018). Lifetime Reliability-aware Digital ...
Open data for: Duan, S., Zwolinski, M., & Halak, B. (2018). Lifetime Reliability-aware Digital ...
Open data for: Duan, S., Zwolinski, M., & Halak, B. (2018). Lifetime Reliability-aware Digital ...
Meeting reliability targets with viable costs in the nanometer landscape become a significant challe...
Aggressive CMOS technology feature size down-scaling into the deca nanometer regime, while benefitin...
Aggressive CMOS technology feature size down-scaling into the deca nanometer regime, while benefitin...
Rapid device aging in the nano era threatens system lifetime reliability, posing a major intrinsic t...
In safety related applications and in products with long lifetimes reliability is a must. More...
This work concerns appropriate metrics for evaluating microarchitectural enhancements to improve pro...
Publisher Copyright: © 2013 IEEE.An expected lifetime of converters is of great importance for optim...
In nano-scale CMOS technology, circuit reliability is a growing concern for complicated digital circ...
Modern generations of CMOS technology nodes are facing critical causes of hardware reliability failu...
Technology scaling has led to further processor integration, and future manycore chips will have mor...
Technology scaling has led to further processor integration, and future manycore chips will have mor...
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