The LBNL 88-Inch Cyclotron offers broad-spectrum neutrons for single event effects testing. We discuss results from this beamline for neutron soft upsets in Xilinx Virtex-4 and -5 field-programmable-gate-array (FPGA) devices
SIGLEAvailable from British Library Document Supply Centre- DSC:DX177961 / BLDSC - British Library D...
IEEE Catalog Number: CFP15449-ART (XPLORE) ISBN: 978-1-5090-0232-0 (XPLORE) IEEE Catalog Number: CFP...
It is well known that alpha particles cause soft errors in LSI. Recently, it has been found that cos...
The LBNL 88-Inch Cyclotron offers broad-spectrum neutrons for single event effects testing. We discu...
As the dimensions and operating voltage of semiconductor devices are reduced, neutron-induced soft e...
Terrestrial neutron-induced soft errors in semiconductor memory devices are currently a major concer...
International audienceA sensitivity characterization of a Xilinx Artix-7 field programmable gate arr...
described real-time experiments that evaluated large Xilinx FPGAs fabricated in two CMOS technologie...
In outer space down to the altitudes routinely flown by larger aircrafts, radiation can pose serious...
Abstract—This article presents use of a neutron beam for error injection in safety-critical Commerci...
Frontiers in Electronic Testing, Vol. 41, 1st Edition., XVIIISoft Errors in Modern Electronic System...
Atmospheric neutrons are a known source of Soft Errors (SE), in static and dynamic CMOS memories. Th...
Atmospheric neutrons are a known source of Soft Errors (SE), in static and dynamic CMOS memories. Th...
International audienceThis paper presents an experimental study of the sensitivity to 15-MeV neutron...
In the outer space down to the altitudes routinely flown by the larger commercial aircrafts, radiati...
SIGLEAvailable from British Library Document Supply Centre- DSC:DX177961 / BLDSC - British Library D...
IEEE Catalog Number: CFP15449-ART (XPLORE) ISBN: 978-1-5090-0232-0 (XPLORE) IEEE Catalog Number: CFP...
It is well known that alpha particles cause soft errors in LSI. Recently, it has been found that cos...
The LBNL 88-Inch Cyclotron offers broad-spectrum neutrons for single event effects testing. We discu...
As the dimensions and operating voltage of semiconductor devices are reduced, neutron-induced soft e...
Terrestrial neutron-induced soft errors in semiconductor memory devices are currently a major concer...
International audienceA sensitivity characterization of a Xilinx Artix-7 field programmable gate arr...
described real-time experiments that evaluated large Xilinx FPGAs fabricated in two CMOS technologie...
In outer space down to the altitudes routinely flown by larger aircrafts, radiation can pose serious...
Abstract—This article presents use of a neutron beam for error injection in safety-critical Commerci...
Frontiers in Electronic Testing, Vol. 41, 1st Edition., XVIIISoft Errors in Modern Electronic System...
Atmospheric neutrons are a known source of Soft Errors (SE), in static and dynamic CMOS memories. Th...
Atmospheric neutrons are a known source of Soft Errors (SE), in static and dynamic CMOS memories. Th...
International audienceThis paper presents an experimental study of the sensitivity to 15-MeV neutron...
In the outer space down to the altitudes routinely flown by the larger commercial aircrafts, radiati...
SIGLEAvailable from British Library Document Supply Centre- DSC:DX177961 / BLDSC - British Library D...
IEEE Catalog Number: CFP15449-ART (XPLORE) ISBN: 978-1-5090-0232-0 (XPLORE) IEEE Catalog Number: CFP...
It is well known that alpha particles cause soft errors in LSI. Recently, it has been found that cos...