Transmission electron microscopy (TEM) at sub-Angstrom resolution is important for nanotechnology. Identifying atom positions requires appropriate resolution, the ability to separate distinct objects in images. With Cs corrected, the information limit of the TEM controls resolution. The OAM has demonstrated that a resolution of 0.78A is possible. The TEAM (transmission electron achromatic microscope) will be a TEM using hardware correction of Cs with a monochromator to improve its information limit beyond that of the OAM by improvement of the electron-beam energy spread. It is shown that A 300keV HRTEM TEAM does not require a Cc corrector to reach 0.5A as long as beam energy spread and objective-lens current ripple are lowered suff...
The latest generation of high-resolution Cs-corrected HR-S/TEM electron microscopes allows material ...
Since the invention of the transmissionelectron microscope (TEM) in 1931by Max Knoll and Ernst Ruska...
The effect of chromatic aberration (CC) on the spatial resolution in transmission electron microscop...
Transmission electron microscopy (TEM) at sub-Angstrom resolution is important for nanotechnology. I...
Sub-angstrom resolution is important for nanotechnology. Metal atoms can be routinely imaged in TEM ...
Sub-Angstrom resolution is important for nanotechnology. As researchers design and build artificiall...
Twenty-five years ago, the Cowley group at ASU pioneered the use of transmission electron microscopy...
We have demonstrated sub-Angstrom TEM to a resolution of 0.78 Angstrom with the one-Angstrom micros...
Sub-(A) over circle ngstrom transmission electron microscopy has been achieved at the National Cente...
We have demonstrated sub-Angstrom TEM to a resolution of 0.78 Angstrom with the one-Angstrom micros...
We have demonstrated sub-Angstrom TEM to a resolution of 0.78 Angstrom with the one-Angstrom microsc...
Sub-Angstrom TEM of materials requires focal-series reconstruction (FSR) or electron holography to ...
Sub-Angstrom TEM of materials requires focal-series reconstruction (FSR) or electron holography to r...
Aberration correction has brought about a revolution in electron microscopy, with as much progress b...
Transmission electron microscopy is an extremely powerful technique for direct characterization of l...
The latest generation of high-resolution Cs-corrected HR-S/TEM electron microscopes allows material ...
Since the invention of the transmissionelectron microscope (TEM) in 1931by Max Knoll and Ernst Ruska...
The effect of chromatic aberration (CC) on the spatial resolution in transmission electron microscop...
Transmission electron microscopy (TEM) at sub-Angstrom resolution is important for nanotechnology. I...
Sub-angstrom resolution is important for nanotechnology. Metal atoms can be routinely imaged in TEM ...
Sub-Angstrom resolution is important for nanotechnology. As researchers design and build artificiall...
Twenty-five years ago, the Cowley group at ASU pioneered the use of transmission electron microscopy...
We have demonstrated sub-Angstrom TEM to a resolution of 0.78 Angstrom with the one-Angstrom micros...
Sub-(A) over circle ngstrom transmission electron microscopy has been achieved at the National Cente...
We have demonstrated sub-Angstrom TEM to a resolution of 0.78 Angstrom with the one-Angstrom micros...
We have demonstrated sub-Angstrom TEM to a resolution of 0.78 Angstrom with the one-Angstrom microsc...
Sub-Angstrom TEM of materials requires focal-series reconstruction (FSR) or electron holography to ...
Sub-Angstrom TEM of materials requires focal-series reconstruction (FSR) or electron holography to r...
Aberration correction has brought about a revolution in electron microscopy, with as much progress b...
Transmission electron microscopy is an extremely powerful technique for direct characterization of l...
The latest generation of high-resolution Cs-corrected HR-S/TEM electron microscopes allows material ...
Since the invention of the transmissionelectron microscope (TEM) in 1931by Max Knoll and Ernst Ruska...
The effect of chromatic aberration (CC) on the spatial resolution in transmission electron microscop...