Add to ORKGBounding the load capacitance at gate outputs is a standard element in today's electrical correctness methodologies for high-speed digital very large scale integration design. Bounds on load caps improve coupling-noise immunity, reduce degradation of signal transition edges, and reduce delay uncertainty due to coupling noise (Kahng et al. 1998). For clock and test distribution, an additional design requirement is bounding the buffer skew, i.e., the difference between the maximum and the minimum number of buffers over all of the source-to-sink paths in the routing tree, since buffer skew is one of the main factors affecting delay skew (Tellez and Sarrafzadeh 1997). In this paper, we consider algorithms for buffering a given tree with the min...
Interconnect delay has become a critical factor in determining the performance of integrated circuit...
We study the minimum-cost bounded-skewrouting tree (BST) problem under the linear delay model. This ...
Interconnect delay has become a critical factor in determining the performance of integrated circuit...
Abstract—Bounding the load capacitance at gate outputs is a standard element in today’s electrical c...
In high-speed digital VLSI design, bounding the load capacitance at gate outputs is a well-known met...
In high-speed digital VLSI design, bounding the load capacitance at gate outputs is a well-known met...
In high-speed digital VLSI design, bounding the load capacitance at gate outputs is a well-known met...
In high-speed digital VLSI design, bounding the load capacitance at gate outputs is a well-known met...
In high-speed digital VLSI design, bounding the load capacitance at gate outputs is a well-known met...
In ultra-deep submicron VLSI designs, clock network layout plays an increasingly important role on d...
We propose a grid-graph algorithm for interconnect routing and buffer insertion in nanometer VLSI la...
With the wide use of hard macros and IP blocks in design, buffered routing (simultaneous routing and...
Cloc distribution iscvV(Nj for timing and designcsi vergenc in high-performanc very largescVN i...
: For engineering tradeoffs in "zero-skew" clock tree routing, for performance-driven Stei...
Abstract- As gate delays decrease faster than wire delays for each technology generation, buffer ins...
Interconnect delay has become a critical factor in determining the performance of integrated circuit...
We study the minimum-cost bounded-skewrouting tree (BST) problem under the linear delay model. This ...
Interconnect delay has become a critical factor in determining the performance of integrated circuit...
Abstract—Bounding the load capacitance at gate outputs is a standard element in today’s electrical c...
In high-speed digital VLSI design, bounding the load capacitance at gate outputs is a well-known met...
In high-speed digital VLSI design, bounding the load capacitance at gate outputs is a well-known met...
In high-speed digital VLSI design, bounding the load capacitance at gate outputs is a well-known met...
In high-speed digital VLSI design, bounding the load capacitance at gate outputs is a well-known met...
In high-speed digital VLSI design, bounding the load capacitance at gate outputs is a well-known met...
In ultra-deep submicron VLSI designs, clock network layout plays an increasingly important role on d...
We propose a grid-graph algorithm for interconnect routing and buffer insertion in nanometer VLSI la...
With the wide use of hard macros and IP blocks in design, buffered routing (simultaneous routing and...
Cloc distribution iscvV(Nj for timing and designcsi vergenc in high-performanc very largescVN i...
: For engineering tradeoffs in "zero-skew" clock tree routing, for performance-driven Stei...
Abstract- As gate delays decrease faster than wire delays for each technology generation, buffer ins...
Interconnect delay has become a critical factor in determining the performance of integrated circuit...
We study the minimum-cost bounded-skewrouting tree (BST) problem under the linear delay model. This ...
Interconnect delay has become a critical factor in determining the performance of integrated circuit...