Add to ORKGHigh-resolution transmission electron microscopy (HRTEM) employing focus-variation phase-reconstruction methods is used to image the atomic structure of grain boundaries in a silicon nitride ceramic at a resolution of 0.8 Angstro
Recent results of high-resolution electron microscopy on Si_3N_4 and SiC are presented and reviewed....
International audienceThe structure of a ß′-SiAlON (Si5.6Al0.4O0.4N7.6) has been observed using thre...
This study aims to investigate the effects of defocus, sample thickness, accelerating voltage and ap...
High-resolution transmission electron microscopy (HRTEM) employing focus-variation phase-reconstruct...
High-resolution transmission electron microscopy is utilized to examine the crystal structure of a s...
The thin intergranular phase in a silicon nitride (Si3N4)ceramic, which has been regarded for decade...
Grain boundaries in silicon-based ceramics have been characterized by high resolution electron micro...
The thin intergranular phase in a silicon nitride (Si3N4) ceramic, which has been regarded for deca...
The microstructure of ceramic materials can now be observed directly at the atomic level by using hi...
The bulk properties of a large range of materials are controlled by the atomic structure and chemist...
The microstructure and the chemical composition of the grain boundary phase of silicon nitrides cont...
Recently, the scanning transmission electron microscope has become capable of forming electron probe...
Recently, the scanning transmission electron microscope has become capable of forming electron probe...
In the course of a thorough investigation of the performance-structure-chemistry interdependency at ...
Silicon nitride is an extensively studied ceramics material due to its desirable physical and mechan...
Recent results of high-resolution electron microscopy on Si_3N_4 and SiC are presented and reviewed....
International audienceThe structure of a ß′-SiAlON (Si5.6Al0.4O0.4N7.6) has been observed using thre...
This study aims to investigate the effects of defocus, sample thickness, accelerating voltage and ap...
High-resolution transmission electron microscopy (HRTEM) employing focus-variation phase-reconstruct...
High-resolution transmission electron microscopy is utilized to examine the crystal structure of a s...
The thin intergranular phase in a silicon nitride (Si3N4)ceramic, which has been regarded for decade...
Grain boundaries in silicon-based ceramics have been characterized by high resolution electron micro...
The thin intergranular phase in a silicon nitride (Si3N4) ceramic, which has been regarded for deca...
The microstructure of ceramic materials can now be observed directly at the atomic level by using hi...
The bulk properties of a large range of materials are controlled by the atomic structure and chemist...
The microstructure and the chemical composition of the grain boundary phase of silicon nitrides cont...
Recently, the scanning transmission electron microscope has become capable of forming electron probe...
Recently, the scanning transmission electron microscope has become capable of forming electron probe...
In the course of a thorough investigation of the performance-structure-chemistry interdependency at ...
Silicon nitride is an extensively studied ceramics material due to its desirable physical and mechan...
Recent results of high-resolution electron microscopy on Si_3N_4 and SiC are presented and reviewed....
International audienceThe structure of a ß′-SiAlON (Si5.6Al0.4O0.4N7.6) has been observed using thre...
This study aims to investigate the effects of defocus, sample thickness, accelerating voltage and ap...