Field programmable gate arrays (FPGAs) use memory cells, primarily static random-access memory (SRAM) cells to implement field programmability for logic and interconnect, which is a preferable platform due to its high performance and low non-recurring engineering cost. To increase the logic density and the integration capability, modern FPGAs use ever advancing process technologies and smaller devices. However, smaller devices are more vulnerable to environmental upsets caused by high energy particle hits and internal noise, and may change their logic states as a result. Such an upset is called a "Soft Error"', which is recently acknowledged as the most critical reliability issue for FPGAs.In the contexts of system failure and circuit funct...
\u3cp\u3eStatic Random-Access Memory-based (SRAM-based) Field-Programmable Gate Arrays (FPGAs) are w...
Radiation-induced Soft Errors are widely known since the advent of dynamic RAM chips. Reconfigurable...
ISBN 978-1-4673-1206-6International audienceSoft errors in the configuration memory of SRAM-based FP...
Field-programmable gate arrays (FPGAs) are increasingly susceptible to radiation-induced single even...
Static Random-Access Memory-based (SRAM-based) Field-Programmable Gate Arrays (FPGAs) are widely use...
Static Random-Access Memory-based (SRAM-based) Field-Programmable Gate Arrays (FPGAs) are widely use...
Static Random-Access Memory-based (SRAM-based) Field-Programmable Gate Arrays (FPGAs) are widely use...
Static Random-Access Memory-based (SRAM-based) Field-Programmable Gate Arrays (FPGAs) are widely use...
Fault-tolerance in integrated circuits is no longer the exclusive concern of space designers or high...
This paper presents a novel design flow for the implementation of digital systems onto SRAM-based FP...
Static Random-Access Memory-based (SRAM-based) Field-Programmable Gate Arrays (FPGAs) are widely use...
This paper presents a novel design flow for the implementation of digital systems onto SRAM-based FP...
This paper presents a novel design flow for the implementation of digital systems onto SRAM-based FP...
This paper presents a novel design flow for the implementation of digital systems onto SRAM-based FP...
ISBN 978-1-4799-1312-1International audienceProduct or design quality encompasses many aspects. One ...
\u3cp\u3eStatic Random-Access Memory-based (SRAM-based) Field-Programmable Gate Arrays (FPGAs) are w...
Radiation-induced Soft Errors are widely known since the advent of dynamic RAM chips. Reconfigurable...
ISBN 978-1-4673-1206-6International audienceSoft errors in the configuration memory of SRAM-based FP...
Field-programmable gate arrays (FPGAs) are increasingly susceptible to radiation-induced single even...
Static Random-Access Memory-based (SRAM-based) Field-Programmable Gate Arrays (FPGAs) are widely use...
Static Random-Access Memory-based (SRAM-based) Field-Programmable Gate Arrays (FPGAs) are widely use...
Static Random-Access Memory-based (SRAM-based) Field-Programmable Gate Arrays (FPGAs) are widely use...
Static Random-Access Memory-based (SRAM-based) Field-Programmable Gate Arrays (FPGAs) are widely use...
Fault-tolerance in integrated circuits is no longer the exclusive concern of space designers or high...
This paper presents a novel design flow for the implementation of digital systems onto SRAM-based FP...
Static Random-Access Memory-based (SRAM-based) Field-Programmable Gate Arrays (FPGAs) are widely use...
This paper presents a novel design flow for the implementation of digital systems onto SRAM-based FP...
This paper presents a novel design flow for the implementation of digital systems onto SRAM-based FP...
This paper presents a novel design flow for the implementation of digital systems onto SRAM-based FP...
ISBN 978-1-4799-1312-1International audienceProduct or design quality encompasses many aspects. One ...
\u3cp\u3eStatic Random-Access Memory-based (SRAM-based) Field-Programmable Gate Arrays (FPGAs) are w...
Radiation-induced Soft Errors are widely known since the advent of dynamic RAM chips. Reconfigurable...
ISBN 978-1-4673-1206-6International audienceSoft errors in the configuration memory of SRAM-based FP...