Incorporating self-repair capabilities to memories is a standard practice to reduce yield loss from hardware defects. OpenRAM is an open-source memory compilation framework that supports the automated generation of Static Random Access Memories (SRAMs). This thesis extends the OpenRAM memory compiler with a built-in self-repair (BISR) feature. The self-repair logic is implemented as a synthesizable Verilog wrapper, and the OpenRAM SRAM is augmented to include extra rows and columns for remapping faulty memory cells
Built-in self -test (BIST) refers to those testing techniques where additional hardware is added to ...
With the increasing demand of memories in system-on-chip (SOC) designs, developing efficient yield-i...
[[abstract]]© 2007 Institute of Electrical and Electronics Engineers - The demand for built-in self-...
Abstract- This paper proposes Built-In Self-Repair Analyzer (BISR) strategy with Redundancy which is...
Abstract—In this paper, a built-in self repair technique for word-oriented two-port SRAM memories is...
In modern SOCs, embedded memories occupy the largest part of the chip area and include an even large...
This research focuses on a CAD tool, BISRAMGEN, that synthesizes layout geometries of built-in self-...
[[abstract]]Embedded memories are among the most widely used cores in current system-on-chip (SOC) i...
Built-in self repair (BISR) for RAMs is an established and widely used approach to increase system-o...
[[abstract]]We propose an embedded processor-based built-in self-repair (BISR) design for embedded m...
A novel physical design tool, BISRAMGEN, that gen-erates layout geometries of parametrized built-in ...
The emerging field of self-repair computing is expected to have a major impact on deployable systems...
As the density of embedded memory increases, manufacturing yields of integrated circuits can reach u...
In academia, many Application Specific Integrated Circuits and System-on-Chip design methodologies a...
Embedded random access memories (RAMs) are increasingly being tested using built-in self-test (BIST)...
Built-in self -test (BIST) refers to those testing techniques where additional hardware is added to ...
With the increasing demand of memories in system-on-chip (SOC) designs, developing efficient yield-i...
[[abstract]]© 2007 Institute of Electrical and Electronics Engineers - The demand for built-in self-...
Abstract- This paper proposes Built-In Self-Repair Analyzer (BISR) strategy with Redundancy which is...
Abstract—In this paper, a built-in self repair technique for word-oriented two-port SRAM memories is...
In modern SOCs, embedded memories occupy the largest part of the chip area and include an even large...
This research focuses on a CAD tool, BISRAMGEN, that synthesizes layout geometries of built-in self-...
[[abstract]]Embedded memories are among the most widely used cores in current system-on-chip (SOC) i...
Built-in self repair (BISR) for RAMs is an established and widely used approach to increase system-o...
[[abstract]]We propose an embedded processor-based built-in self-repair (BISR) design for embedded m...
A novel physical design tool, BISRAMGEN, that gen-erates layout geometries of parametrized built-in ...
The emerging field of self-repair computing is expected to have a major impact on deployable systems...
As the density of embedded memory increases, manufacturing yields of integrated circuits can reach u...
In academia, many Application Specific Integrated Circuits and System-on-Chip design methodologies a...
Embedded random access memories (RAMs) are increasingly being tested using built-in self-test (BIST)...
Built-in self -test (BIST) refers to those testing techniques where additional hardware is added to ...
With the increasing demand of memories in system-on-chip (SOC) designs, developing efficient yield-i...
[[abstract]]© 2007 Institute of Electrical and Electronics Engineers - The demand for built-in self-...