Piezoresponse force microscopy (PFM) is a powerful characterization technique to readily image and manipulate the ferroelectric domains. PFM gives an insight into the strength of local piezoelectric coupling and polarization direction through PFM amplitude and phase, respectively. Converting measured arbitrary units into units of effective piezoelectric constant remains a challenge, and insufficient methods are often used. While most quantification efforts have been spent on quantifying the PFM amplitude signal, little attention has been given to the PFM phase, which is often arbitrarily adjusted to fit expectations. This is problematic when investigating materials with unknown or negative sign of the probed effective electrostrictive coeff...
Scanning Probe Microscopy (SPM) based techniques probe material properties over microscale regions w...
Converse flexoelectricity is a mechanical stress induced by an electric polarization gradient. It ca...
We report on the influence of system-immanent asymmetries on the interpretation of in-plane piezores...
Piezoresponse force microscopy (PFM) probes the mechanical deformation of a sample in response to an...
A novel approach for nanoscale imaging and characterization of the orientation dependence of electro...
Piezoresponse force microscopy (PFM) is commonly used for studying the polarization domain pattern i...
Piezoresponse force-microscopy (PFM) has become the standard tool to investigate ferroelectrics on t...
In order to determine the origin of image contrast in piezoresponse force microscopy (PFM), analytic...
Atomic Force Microscopy (AFM) is a type of Scanning Probe Microscopy (SPM) which involves a probe ti...
The ability to reliably measure electromechanical properties is crucial to the advancement of materi...
In this paper, we review recent advances in piezoresponse force microscopy (PFM) with respect to nan...
Piezoresponse force microscopy (PFM) is one of the most established techniques for the observation a...
The objective of this work is an evaluation of quantitative measurements of piezoresponse force micr...
Surface displacements of a few picometers, occurring after application of an electric potential to p...
The objective of this work is an evaluation of quantitative measurements of piezoresponse force micr...
Scanning Probe Microscopy (SPM) based techniques probe material properties over microscale regions w...
Converse flexoelectricity is a mechanical stress induced by an electric polarization gradient. It ca...
We report on the influence of system-immanent asymmetries on the interpretation of in-plane piezores...
Piezoresponse force microscopy (PFM) probes the mechanical deformation of a sample in response to an...
A novel approach for nanoscale imaging and characterization of the orientation dependence of electro...
Piezoresponse force microscopy (PFM) is commonly used for studying the polarization domain pattern i...
Piezoresponse force-microscopy (PFM) has become the standard tool to investigate ferroelectrics on t...
In order to determine the origin of image contrast in piezoresponse force microscopy (PFM), analytic...
Atomic Force Microscopy (AFM) is a type of Scanning Probe Microscopy (SPM) which involves a probe ti...
The ability to reliably measure electromechanical properties is crucial to the advancement of materi...
In this paper, we review recent advances in piezoresponse force microscopy (PFM) with respect to nan...
Piezoresponse force microscopy (PFM) is one of the most established techniques for the observation a...
The objective of this work is an evaluation of quantitative measurements of piezoresponse force micr...
Surface displacements of a few picometers, occurring after application of an electric potential to p...
The objective of this work is an evaluation of quantitative measurements of piezoresponse force micr...
Scanning Probe Microscopy (SPM) based techniques probe material properties over microscale regions w...
Converse flexoelectricity is a mechanical stress induced by an electric polarization gradient. It ca...
We report on the influence of system-immanent asymmetries on the interpretation of in-plane piezores...