Grazing-incidence small-angle X-ray scattering (GISAXS) is an important technique in the characterization of samples at the nanometre scale. A key aspect of GISAXS data analysis is the accurate simulation of samples to match the measurement. The distorted-wave Born approximation (DWBA) is a widely used model for the simulation of GISAXS patterns. For certain classes of sample such as nanostructures embedded in thin films, where the electric field intensity variation is significant relative to the size of the structures, a multi-slice DWBA theory is more accurate than the conventional DWBA method. However, simulating complex structures in the multi-slice setting is challenging and the algorithms typically used are designed on a case-by-case ...
The application of the grazing-incidence small- angle X-ray scattering (GISAXS) technique for the in...
The complex nano-morphology of modern soft-matter materials is successfully probed with advanced gra...
Grazing-incidence small-angle X-ray scattering (GISAXS) has been used to structurally characterize m...
A fast, flexible 2D GISAXS simulation method based on the distorted-wave Born approximation (DWBA) h...
A method to calculate the location of all Bragg diffraction peaks from nanostructured thin films for...
X-ray scattering is a valuable tool for measuring the structural properties of materialsused in the ...
The dataset consists of 50000 X-ray diffraction patterns simulated by BornAgain [1] software. For ea...
The semiconductor industry is continuously pushing the limits of photolithography, with feature size...
The multiple scattering effects present in grazing-incidence small-angle X-ray scattering (GISAXS) d...
We have developed a 3 dimensional Coherent Diffraction Imaging algorithm to retrieve phases of diffr...
The differential scattering cross section for diffuse scattering of X-rays from thinfilm structures ...
In this article we discuss the applicability of global scattering functions for structure analysis ...
The combination of grazing-incidence small-angle x-ray scattering (GISAXS) with tomographic methods ...
The present paper focuses on the analysis of grazing incidence small-angle x-ray scattering (GISAXS)...
The equations taking into account refraction at the sample surface in grazing-incidence small-angle ...
The application of the grazing-incidence small- angle X-ray scattering (GISAXS) technique for the in...
The complex nano-morphology of modern soft-matter materials is successfully probed with advanced gra...
Grazing-incidence small-angle X-ray scattering (GISAXS) has been used to structurally characterize m...
A fast, flexible 2D GISAXS simulation method based on the distorted-wave Born approximation (DWBA) h...
A method to calculate the location of all Bragg diffraction peaks from nanostructured thin films for...
X-ray scattering is a valuable tool for measuring the structural properties of materialsused in the ...
The dataset consists of 50000 X-ray diffraction patterns simulated by BornAgain [1] software. For ea...
The semiconductor industry is continuously pushing the limits of photolithography, with feature size...
The multiple scattering effects present in grazing-incidence small-angle X-ray scattering (GISAXS) d...
We have developed a 3 dimensional Coherent Diffraction Imaging algorithm to retrieve phases of diffr...
The differential scattering cross section for diffuse scattering of X-rays from thinfilm structures ...
In this article we discuss the applicability of global scattering functions for structure analysis ...
The combination of grazing-incidence small-angle x-ray scattering (GISAXS) with tomographic methods ...
The present paper focuses on the analysis of grazing incidence small-angle x-ray scattering (GISAXS)...
The equations taking into account refraction at the sample surface in grazing-incidence small-angle ...
The application of the grazing-incidence small- angle X-ray scattering (GISAXS) technique for the in...
The complex nano-morphology of modern soft-matter materials is successfully probed with advanced gra...
Grazing-incidence small-angle X-ray scattering (GISAXS) has been used to structurally characterize m...