Add to ORKGAn overview of GISAXS analysis for ionomer thin films is presented. Experimental procedures to prepare and measure thin films using GISAXS is described. Typical features of ionomer scattering images are discussed before detailing three different types of analysis which can be used in conjunction with one another to elucidate additional information from scattering patterns. Example data are provided to illustrate these techniques
The combination of grazing incidence small angle x-ray scattering (GISAXS) and grazing incidence wid...
The application of XPS for film thickness analyses of overlayer thin films, the structure analysis o...
Grazing-incidence small-angle X-ray scattering has become a widely used technique for the morphologi...
An overview of GISAXS analysis for ionomer thin films is presented. Experimental procedures to prepa...
In this method, the incident beam is totally externally reflected from a surface or substrate, follo...
Grazing incidence small angle x-ray scattering (GISAXS) is a powerful technique for morphology inves...
A non-destructive characterization of the structure in nanostructured thin films and multilayers is ...
In this article we discuss the applicability of global scattering functions for structure analysis ...
With the advent of third-generation synchrotron sources and the development of fast two-dimensional ...
The multiple scattering effects present in grazing-incidence small-angle X-ray scattering (GISAXS) d...
The grazing incidence small-angle X-ray scattering (GISAXS) from structures within a thin film on a ...
Grazing incidence scattering, sometimes Grazing Incidence Diffraction (GID) or Grazing Incidence X-r...
Grazing-incidence X-ray scattering (GIXS) formulas for hexagonally perforated layer (HPL) structures...
Scattering techniques are a powerful tool for probing thin-film nanomorphologies but often require a...
Grazing incidence small-angle X-ray scattering (GISAXS) was applied in the study of semiconductor na...
The combination of grazing incidence small angle x-ray scattering (GISAXS) and grazing incidence wid...
The application of XPS for film thickness analyses of overlayer thin films, the structure analysis o...
Grazing-incidence small-angle X-ray scattering has become a widely used technique for the morphologi...
An overview of GISAXS analysis for ionomer thin films is presented. Experimental procedures to prepa...
In this method, the incident beam is totally externally reflected from a surface or substrate, follo...
Grazing incidence small angle x-ray scattering (GISAXS) is a powerful technique for morphology inves...
A non-destructive characterization of the structure in nanostructured thin films and multilayers is ...
In this article we discuss the applicability of global scattering functions for structure analysis ...
With the advent of third-generation synchrotron sources and the development of fast two-dimensional ...
The multiple scattering effects present in grazing-incidence small-angle X-ray scattering (GISAXS) d...
The grazing incidence small-angle X-ray scattering (GISAXS) from structures within a thin film on a ...
Grazing incidence scattering, sometimes Grazing Incidence Diffraction (GID) or Grazing Incidence X-r...
Grazing-incidence X-ray scattering (GIXS) formulas for hexagonally perforated layer (HPL) structures...
Scattering techniques are a powerful tool for probing thin-film nanomorphologies but often require a...
Grazing incidence small-angle X-ray scattering (GISAXS) was applied in the study of semiconductor na...
The combination of grazing incidence small angle x-ray scattering (GISAXS) and grazing incidence wid...
The application of XPS for film thickness analyses of overlayer thin films, the structure analysis o...
Grazing-incidence small-angle X-ray scattering has become a widely used technique for the morphologi...