Experimental setups are being prepared to test and to qualify electronic devices regarding their tolerance to Single Event Effect (SEE). A multiple test setup and a new beam line developed especially for SEE studies at the São Paulo 8 UD Pelletron accelerator were prepared. This accelerator produces proton beams and heavy ion beams up to 107Ag. A Super conducting Linear accelerator, which is under construction, may fulfill all of the European Space Agency requirements to qualify electronic components for SEE
With the aim of developing a radiation-tolerant circuit, a digital test microelectronic device has b...
We present the results of single event effects (SEE) testing and analysis investigating the effects ...
Space radiation can affect performance of electronic components during a satellite's mission. In ord...
Semiconductor devices used in space applications suffer degradation due to the space radiation envir...
Space radiation often affects the electronic components' performance during the mission duration. In...
Efeitos de radiação em dispositivos eletrônicos são uma preocupação em diversas áreas, como em missõ...
In 1972, when engineers at Hughes Aircraft Corporation discovered that errors in their satellite avi...
Experimental methods are emphatically described for doing Single Event Effects (SEE) experiments on ...
We present the results of single event effects (SEE) testing and analysis investigating the effects ...
We present the results of single event effects (SEE) testing and analysis investigating the effects ...
We present the results of single events effects (SEE) testing and analysis investigating the effects...
Abstract: The Cosmic Ray Energetics and Mass (CREAM) instrument is currently being reconfigured for ...
Space radiation can affect performance of electronic components during a satellite's mission. In ord...
Since early 60s of the last century, single event effects (SEEs) caused by particles from cosmic ray...
Single event effect data is presented on the Analog Devices AD7984. The recent heavy-ion test result...
With the aim of developing a radiation-tolerant circuit, a digital test microelectronic device has b...
We present the results of single event effects (SEE) testing and analysis investigating the effects ...
Space radiation can affect performance of electronic components during a satellite's mission. In ord...
Semiconductor devices used in space applications suffer degradation due to the space radiation envir...
Space radiation often affects the electronic components' performance during the mission duration. In...
Efeitos de radiação em dispositivos eletrônicos são uma preocupação em diversas áreas, como em missõ...
In 1972, when engineers at Hughes Aircraft Corporation discovered that errors in their satellite avi...
Experimental methods are emphatically described for doing Single Event Effects (SEE) experiments on ...
We present the results of single event effects (SEE) testing and analysis investigating the effects ...
We present the results of single event effects (SEE) testing and analysis investigating the effects ...
We present the results of single events effects (SEE) testing and analysis investigating the effects...
Abstract: The Cosmic Ray Energetics and Mass (CREAM) instrument is currently being reconfigured for ...
Space radiation can affect performance of electronic components during a satellite's mission. In ord...
Since early 60s of the last century, single event effects (SEEs) caused by particles from cosmic ray...
Single event effect data is presented on the Analog Devices AD7984. The recent heavy-ion test result...
With the aim of developing a radiation-tolerant circuit, a digital test microelectronic device has b...
We present the results of single event effects (SEE) testing and analysis investigating the effects ...
Space radiation can affect performance of electronic components during a satellite's mission. In ord...