Different methods exist in relation to probing and investigating thephysical and structural composition of materials especially detectors whoseusage have become an integral part of radiation detection. The use of thescanning electron microscopy is just one of such exploratory methods. Thistechnique uses a focused beam of high-energy electrons to generate a varietyof signals at the surface of the device under investigationThis thesis presents the results derived from signals from electron beamsampleinteractions, revealing information about the different cleanroomfabricated electron detectors used. This information includes the detector’sexternal morphology and texture, surface recombination, fixed oxide chargeand the behavioral characteristi...
This work contains theory about scanning electron microscopy. It describes construction, principle o...
The authors analysed the conditions of the secondary electron detection with the use of the lower th...
The thesis deals with the characterization of a semiconductor detector of backscattered electrons. T...
AbstractRecent progress in detector design has created the need for a careful side-by-side compariso...
The thesis deals with the scintillation secondary electron detector for environmental scanning elect...
There has been an increase in the use of duo‐lateral position sensitive detectors inpractically ever...
This thesis deals with problematics of a detection of secondary electrons by ionization detector for...
The article deals with a prezentation of results of optimization of secondary electron detection by ...
The dissertation thesis deals with signal detection by an ionization detector in the environmental s...
The thesis deals with the study of properties of a new system for detection of true secondary and ba...
This thesis is focused on the environmental scanning electron microscopes including a description of...
Presented work deals with environmental scanning electron microscopy. The construction of the device...
This work contains description of basic properties and principles of electron microscopy focused on ...
The thesis deals with modifying and biulding of scintilation detector of secondary electrons for env...
Thesis deals with theoretical knowledge about scanning electron microscopy and environmental scannin...
This work contains theory about scanning electron microscopy. It describes construction, principle o...
The authors analysed the conditions of the secondary electron detection with the use of the lower th...
The thesis deals with the characterization of a semiconductor detector of backscattered electrons. T...
AbstractRecent progress in detector design has created the need for a careful side-by-side compariso...
The thesis deals with the scintillation secondary electron detector for environmental scanning elect...
There has been an increase in the use of duo‐lateral position sensitive detectors inpractically ever...
This thesis deals with problematics of a detection of secondary electrons by ionization detector for...
The article deals with a prezentation of results of optimization of secondary electron detection by ...
The dissertation thesis deals with signal detection by an ionization detector in the environmental s...
The thesis deals with the study of properties of a new system for detection of true secondary and ba...
This thesis is focused on the environmental scanning electron microscopes including a description of...
Presented work deals with environmental scanning electron microscopy. The construction of the device...
This work contains description of basic properties and principles of electron microscopy focused on ...
The thesis deals with modifying and biulding of scintilation detector of secondary electrons for env...
Thesis deals with theoretical knowledge about scanning electron microscopy and environmental scannin...
This work contains theory about scanning electron microscopy. It describes construction, principle o...
The authors analysed the conditions of the secondary electron detection with the use of the lower th...
The thesis deals with the characterization of a semiconductor detector of backscattered electrons. T...