Add to ORKGThe goal of this experiment is to use the Atomic Force Microscope (AFM) to get images of selected items and determine some distances of the characteristics of each sample. The ultimate goal is to measure the length of a nanotube, but unfortunately there were none left on the slide that was supposed to contain them. From the results of the lab and the lab manual of “companies” with possible lengths for each sample, Lindaas-Lahti Industries seems to have the best fit overall
The development of atomic force microscopy (AFM) over the past 20 years has had a major impact on ma...
Traditionally, atomic force microscopy (AFM) experiments are conducted at tip-sample distances where...
The scanning tunneling microscope is proposed as a method to measure forces as small as 10−18 N. As ...
The goal of this experiment is to use the Atomic Force Microscope (AFM) to get images of selected it...
The goal of this experiment is to use the Atomic Force Microscope (AFM) to get images of selected it...
Recently, Binnig, Quate, and Gerber developed the atomic force microscope (AFM), an instrument which...
In this study, atomic force microscopy (AFM) tip profile was introduced and examined on carbon nano...
In this study, atomic force microscopy (AFM) tip profile was introduced and examined on carbon nano...
Color poster with text, diagrams, images, and graphs.An Atomic Force Microscope, or AFM, is a resear...
Since it was invented by Binnig et al in 1986, atomic force microscopy (AFM) has played a crucial ro...
The Atomic Force Microscope (AFM) is an important instrument in nanoscale topography, but it is expe...
Atomic force microscopes (AFMs) are ubiquitous in research laboratories and have recently been price...
It is a well‐known fact in scanning probe microscopy that the tip geometry will be convoluted with t...
Thesis: S.M., Massachusetts Institute of Technology, Department of Mechanical Engineering, 2015.Cata...
Optical microscopy uses the interactions between light and materials to provide images of the micros...
The development of atomic force microscopy (AFM) over the past 20 years has had a major impact on ma...
Traditionally, atomic force microscopy (AFM) experiments are conducted at tip-sample distances where...
The scanning tunneling microscope is proposed as a method to measure forces as small as 10−18 N. As ...
The goal of this experiment is to use the Atomic Force Microscope (AFM) to get images of selected it...
The goal of this experiment is to use the Atomic Force Microscope (AFM) to get images of selected it...
Recently, Binnig, Quate, and Gerber developed the atomic force microscope (AFM), an instrument which...
In this study, atomic force microscopy (AFM) tip profile was introduced and examined on carbon nano...
In this study, atomic force microscopy (AFM) tip profile was introduced and examined on carbon nano...
Color poster with text, diagrams, images, and graphs.An Atomic Force Microscope, or AFM, is a resear...
Since it was invented by Binnig et al in 1986, atomic force microscopy (AFM) has played a crucial ro...
The Atomic Force Microscope (AFM) is an important instrument in nanoscale topography, but it is expe...
Atomic force microscopes (AFMs) are ubiquitous in research laboratories and have recently been price...
It is a well‐known fact in scanning probe microscopy that the tip geometry will be convoluted with t...
Thesis: S.M., Massachusetts Institute of Technology, Department of Mechanical Engineering, 2015.Cata...
Optical microscopy uses the interactions between light and materials to provide images of the micros...
The development of atomic force microscopy (AFM) over the past 20 years has had a major impact on ma...
Traditionally, atomic force microscopy (AFM) experiments are conducted at tip-sample distances where...
The scanning tunneling microscope is proposed as a method to measure forces as small as 10−18 N. As ...