Every new development in device performance and packaging design, due to new materials and design changes can influence the device reliability drastically. High performance and high reliability demands in power electronics over several decades and a short time to market development, raise the need for very fast reliability testing methods. In this study a mechanical fatigue testing method is presented for evaluating the interfacial fatigue resistance of heavy Al wire bonded interconnects in high power modules. By separating the concurrent thermal, mechanical and environmental failure mechanisms a selective investigation of the desired failure mode is possible. The setup is designed to reproduce the thermo...
The reliability of power electronic devices is mainly limited due to thermo-mechanical fatigue of th...
Rissbildung in der Verbindungszone zwischen Al-Dickdrahtbond und Leistungshalbleiter-chip durch ther...
Power electronic advancement trends indicate that device power density will continue to increase as ...
Every new development in device performance and packaging design, can drastically affect the reliabi...
In this study a high frequency mechanical fatigue testing procedure for evaluation of interfacial re...
This article presents various experimental studies on fatigue evaluation of wire bond interconnects...
AbstractDue to the rapid development of packaging industry accelerated reliability testing for evalu...
Fatigue cracking in the inter-face between the heavy Al wire and the Al metallization of the power s...
Development of advanced electronic packages can be drastically affected by implementation of new mat...
Ultrasonically bonded Al wire bonds on Al metallization pads are widely used in power semiconductors...
Abstract. We demonstrate the use of electrical methods for evaluating the thermomechanical fatigue p...
Wire bonding is still the dominant interconnection technology for power semiconductors in power modu...
In this study, a technology-oriented simplified mechanical fatigue testing approach for aluminium he...
Aluminum wire bonds, as used in a ceramic air cavity package for LDMOS, will intrinsically be prone ...
Based on the assumption that even properly manufactured bond interconnections are getting destroyed ...
The reliability of power electronic devices is mainly limited due to thermo-mechanical fatigue of th...
Rissbildung in der Verbindungszone zwischen Al-Dickdrahtbond und Leistungshalbleiter-chip durch ther...
Power electronic advancement trends indicate that device power density will continue to increase as ...
Every new development in device performance and packaging design, can drastically affect the reliabi...
In this study a high frequency mechanical fatigue testing procedure for evaluation of interfacial re...
This article presents various experimental studies on fatigue evaluation of wire bond interconnects...
AbstractDue to the rapid development of packaging industry accelerated reliability testing for evalu...
Fatigue cracking in the inter-face between the heavy Al wire and the Al metallization of the power s...
Development of advanced electronic packages can be drastically affected by implementation of new mat...
Ultrasonically bonded Al wire bonds on Al metallization pads are widely used in power semiconductors...
Abstract. We demonstrate the use of electrical methods for evaluating the thermomechanical fatigue p...
Wire bonding is still the dominant interconnection technology for power semiconductors in power modu...
In this study, a technology-oriented simplified mechanical fatigue testing approach for aluminium he...
Aluminum wire bonds, as used in a ceramic air cavity package for LDMOS, will intrinsically be prone ...
Based on the assumption that even properly manufactured bond interconnections are getting destroyed ...
The reliability of power electronic devices is mainly limited due to thermo-mechanical fatigue of th...
Rissbildung in der Verbindungszone zwischen Al-Dickdrahtbond und Leistungshalbleiter-chip durch ther...
Power electronic advancement trends indicate that device power density will continue to increase as ...