Round-Robin Measurements of Linewidth Enhancement Factor of Semiconductor Lasers in COST 288 Action
- Giuliani, Guido
- Donati, Silvano
- Villafranca, Asier
- Lasobras, Javier
- Garces, Ignacio
- Chacinski, Marek
- Schatz, Richard
- Kouloumentas, Christos
- Klonidis, Dimitrios
- Tomkos, Ioannis
- Landais, Pascal
- Escorihuela, Raul
- Rorison, Judy
- Pozo, Jose
- Fiore, Andrea
- Moreno, Pablo
- Rossetti, Marco
- Elsäßer, Wolfgang
- Von Staden, Jens
- Huyet, Guillaume
- Saarinen, Mika
- Pessa, Markus
- Leinonen, Pirjo
- Vilokkinen, Ville
- Sciamanna, Marc
- Danckaert, Jan
- Panajotov, Krassimir
- Fordell, Thomas
- Lindberg, Asa
- Hayau, Jean-François
- Poette, Julien
- Besnard, Pascal
- GRILLOT, Frédéric
- Pereira, Mauro
- Nelander, Rikard
- Wacker, Andreas
- Tredicucci, Alessandro
- Green, Richard,
Publication date
June 2007
DOI Publisher
Institute of Electrical and Electronics Engineers (IEEE)Abstract
International audienceRound-Robin measurements on the linewidth enhancement factor are carried out in many laboratories participating to EU COST 288 Action. Up to 7 different techniques are applied to DFB, VCSELs, QCL, and QD lasers, and results are compared
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