Add to ORKGInternational audienceComponent models that predict functional failure are necessary for predicting the immunity of systems to electromagnetic interference (EMI). A method to extract these models using measurements on integrated circuits (ICs) already exists. This measurement method for ICs with single-ended connections is extended, to include ICs with differential connections. The LM2902 op-amp is measured and modeled as a first case study
De nos jours, la modélisation de la compatibilité électromagnétique est devenue une étape importante...
WOSInternational audienceThis paper introduces a new technique for electromagnetic immunity modeling...
International audienceThis paper focus on the conducted immunity measurement of non-volatile memorie...
International audienceComponent models that predict functional failure are necessary for predicting ...
Component models that predict functional failure are necessary for predicting the immunity of system...
International audienceIntegrated circuit (IC) models that predict functional failure are necessary f...
International audienceIntegrated circuit (IC) models that predict functional failure are necessary f...
International audienceThis paper introduces a complete simulation model of a Direct Power Injection ...
International audienceThis paper introduces a complete simulation model of a Direct Power Injection ...
Avec les progrès technologiques réalisés au cours de ces dernières décennies, la complexité et les v...
Dos nos jours, l'évolution croissante des domaines d'application des circuits intégrés impose aux in...
International audienceThis paper presents a methodology dedicated to mod-eling and simulation of low...
International audienceThis paper presents a methodology dedicated to mod-eling and simulation of low...
International audienceThis paper focus on the conducted immunity measurement of non-volatile memorie...
WOSInternational audienceThis paper introduces a new technique for electromagnetic immunity modeling...
De nos jours, la modélisation de la compatibilité électromagnétique est devenue une étape importante...
WOSInternational audienceThis paper introduces a new technique for electromagnetic immunity modeling...
International audienceThis paper focus on the conducted immunity measurement of non-volatile memorie...
International audienceComponent models that predict functional failure are necessary for predicting ...
Component models that predict functional failure are necessary for predicting the immunity of system...
International audienceIntegrated circuit (IC) models that predict functional failure are necessary f...
International audienceIntegrated circuit (IC) models that predict functional failure are necessary f...
International audienceThis paper introduces a complete simulation model of a Direct Power Injection ...
International audienceThis paper introduces a complete simulation model of a Direct Power Injection ...
Avec les progrès technologiques réalisés au cours de ces dernières décennies, la complexité et les v...
Dos nos jours, l'évolution croissante des domaines d'application des circuits intégrés impose aux in...
International audienceThis paper presents a methodology dedicated to mod-eling and simulation of low...
International audienceThis paper presents a methodology dedicated to mod-eling and simulation of low...
International audienceThis paper focus on the conducted immunity measurement of non-volatile memorie...
WOSInternational audienceThis paper introduces a new technique for electromagnetic immunity modeling...
De nos jours, la modélisation de la compatibilité électromagnétique est devenue une étape importante...
WOSInternational audienceThis paper introduces a new technique for electromagnetic immunity modeling...
International audienceThis paper focus on the conducted immunity measurement of non-volatile memorie...