The move to deep submicron processes has brought about new problems that designers must contend with in order to obtain functional circuits. Process variation has been recognized as one of the leading issues that must be dealt with in deep submicron processes. The problems experienced with deep submicron processes have ushered in a new era of statistical design, in which process parameters are no longer considered to be deterministic but are modeled as probability distributions. In order to support statistical design, new algorithms and methods are needed. One of the chief problems with process variation is the need for accurate timing analysis in which process parameters such as gate length and oxide thickness are now modeled as probabi...
DoctorAggressive technology scaling in feature size has propelled designers to integrate millions of...
Systems have been designed and synthesized using CMOS technology for many years, with improvements i...
This paper proposed the impact of variations on delay in CMOS technology of 32 nm. The magnitude of ...
The move to deep submicron processes has brought about new problems that designers must contend with...
Increasing relative semiconductor process variations are making the prediction of realistic worst-ca...
MasterThe variations of process parameters have increased due to the continued scaling down of semic...
textWith aggressive technology scaling, within-die random variations are becoming the most dominant...
textTechnology scaling in the nanometer era comes with a significant amount of process variation, le...
As CMOS technology scales down, process variation introduces significant uncertainty in power and pe...
As CMOS technology continues to scale down, process variation introduces significant uncertainty in ...
The effect of process variation is getting worse with every technology generation. With variability ...
Timing analysis is a key step in the digital design process. By modeling device delay variations sta...
Abstract—As process variations become a significant problem in deep sub-micron technology, a shift f...
While technology scaling has presented many new and exciting opportunities, new design challenges ha...
An adaptive circuit can perform built-in self-detection of timing variations and accordingly adjust ...
DoctorAggressive technology scaling in feature size has propelled designers to integrate millions of...
Systems have been designed and synthesized using CMOS technology for many years, with improvements i...
This paper proposed the impact of variations on delay in CMOS technology of 32 nm. The magnitude of ...
The move to deep submicron processes has brought about new problems that designers must contend with...
Increasing relative semiconductor process variations are making the prediction of realistic worst-ca...
MasterThe variations of process parameters have increased due to the continued scaling down of semic...
textWith aggressive technology scaling, within-die random variations are becoming the most dominant...
textTechnology scaling in the nanometer era comes with a significant amount of process variation, le...
As CMOS technology scales down, process variation introduces significant uncertainty in power and pe...
As CMOS technology continues to scale down, process variation introduces significant uncertainty in ...
The effect of process variation is getting worse with every technology generation. With variability ...
Timing analysis is a key step in the digital design process. By modeling device delay variations sta...
Abstract—As process variations become a significant problem in deep sub-micron technology, a shift f...
While technology scaling has presented many new and exciting opportunities, new design challenges ha...
An adaptive circuit can perform built-in self-detection of timing variations and accordingly adjust ...
DoctorAggressive technology scaling in feature size has propelled designers to integrate millions of...
Systems have been designed and synthesized using CMOS technology for many years, with improvements i...
This paper proposed the impact of variations on delay in CMOS technology of 32 nm. The magnitude of ...