Experimental Investigations on the Tuning of Active Gate Drivers under Load Current Variations

the Power Electronics Innovation Center (PEIC), Politecnico di Torino,ItalyActive Gate Drivers have gained of interest asthey allow one to shape the switching waveforms finely,thus reducing overshoots and oscillations. However, whenfast power switches are exploited, the tuning of such driversis still challenging. This paper investigates the adjustmentof gate current profile under load variations, which is acrucial issue when targeting practical applications. Indeed,a technique, based on the stretching of time intervals,is proposed and its effectiveness, in terms of undershootreduction, is experimentally assessed.Keywords—Active Gate Driver (AGD), switching wave-forms, AGD tuning, power transistors