Investigation of early degradation processes at coated metals by AC-scanning electrochemical microscopy

Alternating-current scanning electrochemical microscopy (AC-SECM) is employed to characterize the early stages of the degradation reactions occurring in metal-coating systems upon exposure to an aqueous environment. The spatial resolution of the technique results from the measurement of changes in the resistance of the thin electrolyte layer comprised between the tip and the surface of the coating due to variations in the tip-substrate distance. Resistance measurements are conducted at various frequencies of the AC perturbation signal effectively allowing topographic changes to be monitored as a function of time. Furthermore, AC-SECM can be used to determine the tip-substrate distance without the addition of redox mediators to the electrolyte, which might affect the chemical properties of the system. In this way, the effect of chloride ions from the aqueous phase to induce either the heterogeneous absorption of water by the coating, or its accumulation at the metal-substrate interface, has been image