The Verification of Transistors Array Auto Characterization System using Organic Thin-Film Transistors and Array

Active-matrix transistor arrays have been attracting widespread interests due to its several properties such as minimum signal crosstalk between adjacent pixels led from a characteristic of switching individual pixels independently. However, it is challenging to measure and extract reliable statistical data of all transistors in an array circuit in the same condition, by using conventional semiconductor analyzer. In this work, we present a custom-built transistors array auto characterization system and verify its accuracy by comparing data of organic thin-film transistors (TFTs) and its array, which is measured by using the conventional system. First, we verify our measuring algorithm, which is main software of our system, by using p-type polymer based organic TFTs array. Then, we check hardware of our system to find out factors that cause existing current difference. For this process, we used both n- and p-type small molecule based organic TFTs. Finally, we measure 80 TFTs array integrated on a 2.5×2.0 cm2 flexible parylene substrate by using our array measuring system and extract various electrical parameters from the measured transfer characteristics data. Our system represent significant progress of circuit analyzing system with high scanning speed and accuracy, which is a promising assistant of up-coming large-area wearable electronic applications.1