One of the significant limitations of the pulsed laser deposition method in the mass-production-technologies of micro- and nanoelectronic and molecular device electronic fabrication is the issue of ensuring deposition of films with uniform thickness on substrates with large diameter (more than 100 mm) since the area of the laser spot (1–5 mm2) on the surface of the ablated target is incommensurably smaller than the substrate area. This paper reports the methodology that allows to calculate the distribution profile of the film thickness over the surface substrate with a large diameter, taking into account the construction and technological parameters of the pulsed laser deposition equipment. Experimental verification of the proposed methodol...
Electronic devices on flexible polymeric substrates allow new fields of applications. A maskless and...
A new normal-incidence pulsed-laser deposition method is presented. Fe/Mn multilayers were fabricate...
For most applications of thin films, uniformity of film thickness over the substrate area is a neces...
Simple and inexpensive methods of obtaining large‐area uniform in thickness and composition thin fil...
A peculiarity of the pulsed laser deposition technique of thin-film growth which limits its applicab...
PLD of uniform thin films on 4-wafers has been realized by the integration of a PLD-source into a co...
The conventional thin-film deposition equipment of pulsed laser deposition (PLD) has been modified f...
The discovery of high-temperature superconductors, coincident with the development short wavelength ...
The measurement of thickness profiles of films (Co, Ag, Pt) with an ellipsometer, and the time-of-fl...
The lateral material distribution of laser-deposited YBa2Cu3O7−δ films and the density of droplets c...
International audienceThe pulsed laser deposition (PLD) technique has been a common method to grow t...
The pulsed laser deposition (PLD) technique has been a common method to grow thin films such as soli...
The paper describes first results wiht a new designed target/substrate/handling system for LPVD of m...
After the discovery of the perovskite high Tc superconductors in 1986, a rare and almost unknown dep...
The presence of particulates of various shapes and dimensions on surfaces and incorporated into the ...
Electronic devices on flexible polymeric substrates allow new fields of applications. A maskless and...
A new normal-incidence pulsed-laser deposition method is presented. Fe/Mn multilayers were fabricate...
For most applications of thin films, uniformity of film thickness over the substrate area is a neces...
Simple and inexpensive methods of obtaining large‐area uniform in thickness and composition thin fil...
A peculiarity of the pulsed laser deposition technique of thin-film growth which limits its applicab...
PLD of uniform thin films on 4-wafers has been realized by the integration of a PLD-source into a co...
The conventional thin-film deposition equipment of pulsed laser deposition (PLD) has been modified f...
The discovery of high-temperature superconductors, coincident with the development short wavelength ...
The measurement of thickness profiles of films (Co, Ag, Pt) with an ellipsometer, and the time-of-fl...
The lateral material distribution of laser-deposited YBa2Cu3O7−δ films and the density of droplets c...
International audienceThe pulsed laser deposition (PLD) technique has been a common method to grow t...
The pulsed laser deposition (PLD) technique has been a common method to grow thin films such as soli...
The paper describes first results wiht a new designed target/substrate/handling system for LPVD of m...
After the discovery of the perovskite high Tc superconductors in 1986, a rare and almost unknown dep...
The presence of particulates of various shapes and dimensions on surfaces and incorporated into the ...
Electronic devices on flexible polymeric substrates allow new fields of applications. A maskless and...
A new normal-incidence pulsed-laser deposition method is presented. Fe/Mn multilayers were fabricate...
For most applications of thin films, uniformity of film thickness over the substrate area is a neces...