Imaging surface electronic structure of NiAl(110) using low-temperature scanning tunneling microscopy

The surface electronic structure of NiAl(110) is examined by means of scanning tunneling microscopy and spectroscopy at a temperature of 4 K. Topography and conductance images for a wide range of bias voltages reveal wavelike patterns around steps and defects. Fourier transforms of conductance images are used to map the surface electronic structure of NiAl(110). We interpret the patterns in the Fourier transforms in terms of surface resonances, and analyze the details of its dispersion relation E(k∥). A comparison with density-functional-based calculations and photoemission experiments is presented, and alternative explanations for the appearance of structures in Fourier transforms of conductance images are discussed