The need to easily and quickly count larger numbers of nanoparticles, in order to obtain statistically useful size and size-distribution data, is addressed via the use of a readily available, free, public-domain program for particle counting, NIH-Image (and 2 others derived from it, Scion Image and Image J), collectively referred to herein as Image. The best protocols that we have found useful for the use of Image are reported; both appropriate as well as problematic applications of Image are then illustrated with a series of TEM images of Ir(0), Pd(0) and Au(0) nanoclusters. Methods to detect and image nanoclusters with sub-1-nm core diameters are reported and illustrated in the literature with An nanoclusters, an important problem since t...
A large amount of nanomaterial characterization data has been routinely collected by using electron ...
<p>Particles had varying sizes and shapes with an average diameter of 20±5.26 nm.</p
This paper reports an interlaboratory comparison that evaluated a protocol for measuring and analysi...
The need to easily and quickly count larger numbers of nanoparticles, in order to obtain statistical...
The aim of this paper is to introduce a new image analysis program “Nanoannotator” particularly deve...
Metallic nanoparticles were analysed with respect to size and shape by a machine learning approach. ...
AutoDetect-mNP is an unsupervised algorithm capable of detecting and segmenting particles from brigh...
Electron microscopy (EM) represents the most powerful tool to directly characterize the structure of...
An essential application of electron microscopy is to provide feedback to tune the fabrication of na...
With the increasing production and use of engineered nanoparticles it is crucial that their interact...
Electron microscopy (EM) is the gold standard for the characterisation of the morphology (size and s...
As the range of applications for nanoparticle systems continues to expand, the importance of providi...
International audienceScanning Electron Microscopy (SEM) is considered as a reference technique for ...
The morphology of nanoparticles governs their properties for a range of important applications. Thus...
<p>Image reveals particles of varying size and shape with an average particle diameter of 17.46</p
A large amount of nanomaterial characterization data has been routinely collected by using electron ...
<p>Particles had varying sizes and shapes with an average diameter of 20±5.26 nm.</p
This paper reports an interlaboratory comparison that evaluated a protocol for measuring and analysi...
The need to easily and quickly count larger numbers of nanoparticles, in order to obtain statistical...
The aim of this paper is to introduce a new image analysis program “Nanoannotator” particularly deve...
Metallic nanoparticles were analysed with respect to size and shape by a machine learning approach. ...
AutoDetect-mNP is an unsupervised algorithm capable of detecting and segmenting particles from brigh...
Electron microscopy (EM) represents the most powerful tool to directly characterize the structure of...
An essential application of electron microscopy is to provide feedback to tune the fabrication of na...
With the increasing production and use of engineered nanoparticles it is crucial that their interact...
Electron microscopy (EM) is the gold standard for the characterisation of the morphology (size and s...
As the range of applications for nanoparticle systems continues to expand, the importance of providi...
International audienceScanning Electron Microscopy (SEM) is considered as a reference technique for ...
The morphology of nanoparticles governs their properties for a range of important applications. Thus...
<p>Image reveals particles of varying size and shape with an average particle diameter of 17.46</p
A large amount of nanomaterial characterization data has been routinely collected by using electron ...
<p>Particles had varying sizes and shapes with an average diameter of 20±5.26 nm.</p
This paper reports an interlaboratory comparison that evaluated a protocol for measuring and analysi...